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| 臺大學術典藏 |
2020-06-16T06:36:17Z |
Test generation of path delay faults induced by defects in power TSV
|
Shih, C.-J.;Hsieh, S.-A.;Lu, Y.-C.;Li, J.C.-M.;Wu, T.-L.;Chakrabarty, K.; Shih, C.-J.; Hsieh, S.-A.; Lu, Y.-C.; Li, J.C.-M.; Wu, T.-L.; Chakrabarty, K.; YI-CHANG LU |
| 臺大學術典藏 |
2020-06-16T06:36:17Z |
Test generation of path delay faults induced by defects in power TSV
|
Shih, C.-J.;Hsieh, S.-A.;Lu, Y.-C.;Li, J.C.-M.;Wu, T.-L.;Chakrabarty, K.; Shih, C.-J.; Hsieh, S.-A.; Lu, Y.-C.; Li, J.C.-M.; Wu, T.-L.; Chakrabarty, K.; YI-CHANG LU |
| 臺大學術典藏 |
2020-06-11T06:15:26Z |
Test generation of path delay faults induced by defects in power TSV
|
Shih, C.-J.;Hsieh, S.-A.;Lu, Y.-C.;Li, J.C.-M.;Wu, T.-L.;Chakrabarty, K.; Shih, C.-J.; Hsieh, S.-A.; Lu, Y.-C.; Li, J.C.-M.; Wu, T.-L.; Chakrabarty, K.; TZONG-LIN WU |
| 臺大學術典藏 |
2020-06-11T06:15:26Z |
Test generation of path delay faults induced by defects in power TSV
|
Shih, C.-J.;Hsieh, S.-A.;Lu, Y.-C.;Li, J.C.-M.;Wu, T.-L.;Chakrabarty, K.; Shih, C.-J.; Hsieh, S.-A.; Lu, Y.-C.; Li, J.C.-M.; Wu, T.-L.; Chakrabarty, K.; TZONG-LIN WU |
Showing items 1-4 of 4 (1 Page(s) Totally)
1
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