| 元智大學 |
2012-08 |
Using neural network to predict current gain of III-V compound semiconductor epitaxy wafer
|
Chen, P. W. 陳佩雯; Lee, T. C. 李聰智; Chuen-Sheng Cheng |
| 元智大學 |
2012-07 |
Identifying the out-of-control variables of multivariate control chart using ensemble SVM classifiers
|
Chuen-Sheng Cheng; Lee, H. T. |
| 元智大學 |
2012-07 |
Identifying the out-of-control variables of multivariate control chart using ensemble SVM classifiers
|
Chuen-Sheng Cheng; Lee, H. T |
| 元智大學 |
2012-06 |
Early validation method for reliability growth based on environmental stress screening
|
Chuen-Sheng Cheng; Kuan, C. M. |
| 元智大學 |
2012-04 |
The application of design for Six Sigma on high level smart phone development
|
Chuen-Sheng Cheng; Lee, S. C; Chen, P. W.; Huang, K. K. |
| 元智大學 |
2012-04 |
The application of design for Six Sigma on high level smart phone development
|
李世傑(Shih-Chieh Lee); 陳佩雯(Shih-Chieh Lee); 黃國格(Kuo-Ko Huang); Chuen-Sheng Cheng |
| 元智大學 |
2012 |
Early validation method for reliability growth based on environmental stress screening
|
Chuen-Sheng Cheng; Kuan, C. M. |
| 元智大學 |
2012 |
Increasing the sensitivity of cumulative quality control charts for monitoring high-yield process with runs rules
|
Chen, P. W.; Chuen-Sheng Cheng; Chen, S. J. |
| 元智大學 |
2011-12-10 |
應用資料探勘技術於面板異常問題處理之實證研究
|
陳佩雯; 黃國格; 劉志洪; Chuen-Sheng Cheng |
| 元智大學 |
2011-12-10 |
應用整體式分類模型辨識多變量製程變異性異常來源之研究
|
陳佩雯; 李虹葶; 林志鴻; Chuen-Sheng Cheng |
| 元智大學 |
2011-11-05 |
利用氣候溫度以逆向模擬訂定電子產品溫度規格與逆向失效樹分析之研究－以增進產品可靠度達到六標準差設計
|
關季明; Chuen-Sheng Cheng |
| 元智大學 |
2011-11-05 |
以 DMAIC 與 DMADV 雙程序併用模式之六標準差流程改善
|
關季明; Chuen-Sheng Cheng |
| 元智大學 |
2011-11-05 |
應用獨立成分分析技術建立監控產品件內和件間變異之統計製程管制程序
|
洪秀青; 黃國格; Chuen-Sheng Cheng |
| 元智大學 |
2011-11-05 |
應用基因演算法求解相依性累積合格品數管制圖之多目標統計設計
|
陳佩雯; 陳琬昕; Chuen-Sheng Cheng |
| 元智大學 |
2011-09-27 |
Combining ICA and MEWMA for Monitoring Between- Part and Within-Part Variation of Product Measurements
|
Chuen-Sheng Cheng; Chen, P. W.; Huang, K. K.; Lee, H. T. |
| 元智大學 |
2011-09-27 |
A Case Study of Product Reliability Improvement by Using DMAIC Process
|
Kuan, C. M.; Chuen-Sheng Cheng |
| 元智大學 |
2011-08 |
Artificial immune algorithm-based approach to recognizing unnatural patterns among autocorrelated characteristics
|
Cheng, H. P.; Chuen-Sheng Cheng |
| 元智大學 |
2011-05 |
產品與製程開發常用的品質提升手法及技術介紹
|
Chuen-Sheng Cheng |
| 元智大學 |
2011-05 |
產品與製程開發常用的品質提升手法及技術介紹
|
Chuen-Sheng Cheng |
| 元智大學 |
2011-02 |
Estimating the shift size in the process mean with support vector regression and neural networks
|
Chuen-Sheng Cheng; Chen, P. W.; Huang, K. K. |
| 元智大學 |
2011 |
Research on product reliability improvement by using DMAIC process:A case study of cold cathode fluorescent lamp
|
Chuen-Sheng Cheng; Kuan, C. M. |
| 元智大學 |
2010-12 |
An ARL-unbiased approach to setting control limits of CCC-r chart for high-yield processes
|
Chen, P. W; Chuen-Sheng Cheng |
| 元智大學 |
2010-12 |
On statistical design of the cumulative quantity control chart for monitoring high yield processes
|
Chen, P. W; Chuen-Sheng Cheng |
| 元智大學 |
2010-12 |
An ARL-unbiased design of time-between-events control charts with runs rules
|
Chuen-Sheng Cheng; Pei-Wen Chen |
| 元智大學 |
2010-12 |
以特徵值為基礎建構管制圖非隨機樣式之辨識系統
|
林雅竹; 陳佩雯; 李虹葶; Chuen-Sheng Cheng |
