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Institution	Date	Title	Author
臺大學術典藏	2020-04-24T08:53:25Z	Evidence for PT-ferroelectrics interface scenario of different fatigue behaviors between Bi4Ti3O12 and Bi3.25La0.75Ti3O12 thin film capacitors	Chu, M.W.; Ganne, M.; Tessier, P.Y.; Eon, D.; Caldes, M.T.; Brohan, L.

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