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Showing items 1-4 of 4 (1 Page(s) Totally)
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| 國立成功大學 |
2023 |
The Impact of Hot Carrier Injection-Induced Device Degradation for Lower-Power FinFETs
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Chen, Y.-L.;Yeh, W.-K.;Hsu, Hsu H.-T.;Chen, K.-H.;Lien, D.-H.;Lin, W.-C.;Yu, T.-H.;Chiu, Y.-S.;Godwinraj, D.;Godfrey, D.;Wu, C.-H. |
| 國立成功大學 |
2023 |
Hot Carrier Injection Reliability of Fabricated N- and P-Type Multi FinFETs with Different TiN Stacks
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Chen, Y.-L.;Yeh, W.-K.;Hsu, Hsu H.-T.;Chen, K.-H.;Lin, W.-C.;Yu, T.-H.;Chou, H.-T.;Godwin, Raj D.;Godfrey, D. |
| 臺大學術典藏 |
2021-07-02T03:43:07Z |
Thymic microenvironmental abnormalities and thymic selection in NZB.H- 2bm12 mice
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Watanabe Y.; Naiki M.; Wilson T.; Godfrey D.; BOR-LUEN CHIANG; Boyd R.; Ansari A.; Gershwin M.E. |
| 國立臺灣大學 |
1993 |
Thymic Microenvironmental Abnormalities and Thymic Selection in NZB.H-2bm12 Mice
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Watanabe, Y.; Naiki, M.; Wilson. T.; Godfrey, D.; 江伯倫; Boyd, R.; Ansari, A.; Gershwin, M. E.; Watanabe, Y.; Naiki, M.; Wilson. T.; Godfrey, D.; Chiang, B. L.; Boyd, R.; Ansari, A.; Gershwin, M. E. |
Showing items 1-4 of 4 (1 Page(s) Totally)
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