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臺灣學術機構典藏系統 (Taiwan Academic Institutional Repository, TAIR)
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2019臺灣學術機構典藏
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Institution Date Title Author
國立成功大學 2024-12 Study on the fabrication of high-quality hafnium oxide thin films using spatial rotated atomic layer deposition and supercritical fluids treatment Lee;Wen-Hsi;Feng;Chien-Ching;Chen;Guan-Fu;Kuo;Tai-Chen
國立成功大學 2020-11-1 Studies of zwitterionic sulfobetaine functionalized polypropylene surface with or without polyethylene glycol spacer: surface characterization, antibacterial adhesion, and platelet compatibility evaluation Cheng;Chi-Hui;Chen;Guan-Fu;Lin;Jui-Che
國立成功大學 2020-08 Hydrogen Diffusion and Threshold Voltage Shifts in Top-Gate Amorphous InGaZnO Thin-Film Transistors Chen;Hong-Chih;Chen;Jian-Jie;Zhou;Kuan-Ju;Chen;Guan-Fu;Kuo;Chuan-Wei;Shih;Yu-Shan;Su;Wan-Ching;Yang;Chih-Cheng;Huang;Hui-Chun;Shih;Chih-Cheng;Lai;Wei-Chih;Chang;Ting-Chang
國立成功大學 2020-03 Impact of Gate Size on Abnormal Current Rise Under an Electric Field in Organic Thin-Film Transistors Chen;Hong-Chih;Chen;Guan-Fu;Chen;Jian-Jie;Kuo;Chuan-Wei;Zhou;Kuan-Ju;Tu;Yu-Fa;Lu;I-Nien;Shih;Yu-Shan;Sun;Li-Chuan;Huang;Hui-Chun;Wu;Wen-Chi;Lai;Wei-Chih;Chang;Ting-Chang
國立成功大學 2019-12 Formation of Hump Effect Due to Top-Gate Bias Stress in Organic Thin-Film Transistors Chen;Hong-Chih;Chen;Guan-Fu;Huang;Shin-Ping;Chang;Ting-Chang;Chen;Po-Hsun;Chen;Jian-Jie;Kuo;Chuan-Wei;Zhou;Kuan-Ju;Hung;Yang-Hao;Tsao;Yu-Ching;Chu;An-Kuo;Huang;Hui-Chun;Lai;Wei-Chih
國立成功大學 2019-10-30 Investigation of the Capacitance-Voltage Electrical Characteristics of Thin-Film Transistors Caused by Hydrogen Diffusion under Negative Bias Stress in a Moist Environment Chen;Hong-Chih;Kuo;Chuan-Wei;Chang;Ting-Chang;Lai;Wei-Chih;Chen;Po-Hsun;Chen;Guan-Fu;Huang;Shin-Ping;Chen;Jian-Jie;Zhou;Kuan-Ju;Shih;Chih-Cheng;Tsao;Yu-Ching;Huang;Hui-Chun;Sze;Simon, M.
國立成功大學 2019-09 A Novel Heat Dissipation Structure for Inhibiting Hydrogen Diffusion in Top-Gate a-InGaZnO TFTs Chen;Hong-Chih;Chen;Guan-Fu;Chen;Po-Hsun;Huang;Shin-Ping;Chen;Jian-Jie;Zhou;Kuan-Ju;Kuo;Chuan-Wei;Tsao;Yu-Ching;Chu;An-Kuo;Huang;Hui-Chun;Lai;Wei-Chih;Chang;Ting-Chang
國立成功大學 2019-08 Abnormal Unsaturated Output Characteristics In a-InGaZnO TFTs With Light Shielding Layer Chen;Hong-Chih;Zhou;Kuan-Ju;Chen;Po-Hsun;Chen;Guan-Fu;Huang;Shin-Ping;Chen;Jian-Jie;Kuo;Chuan-Wei;Tsao;Yu-Ching;Tai;Mao-Chou;Chu;An-Kuo;Lai;Wei-Chih;Chang;Ting-Chang
國立成功大學 2019-06 An Energy-Band Model for Dual-Gate-Voltage Sweeping in Hydrogenated Amorphous Silicon Thin-Film Transistors Chen;Guan-Fu;Chen;Hong-Chih;Chang;Ting-Chang;Huang;Shin-Ping;Chen;Hua-Mao;Liao;Po-Yung;Chen;Jian-Jie;Kuo;Chuan-Wei;Lai;Wei-Chih;Chu;Ann-Kuo;Lin;Sung-Chun;Yeh;Cheng-Yen;Chang;Chia-Sen;Tsai;Cheng-Ming;Yu;Ming-Chang;Zhang;Shengdong
國立成功大學 2018-08-8 Cyclical Annealing Technique To Enhance Reliability of Amorphous Metal Oxide Thin Film Transistors Chen;Hong-Chih;Chang;Ting-Chang;Lai;Wei-Chih;Chen;Guan-Fu;Chen;Bo-Wei;Hung;Yu-Ju;Chang;Kuo-Jui;Cheng;Kai-Chung;Huang;Chen-Shuo;Chen;Kuo-Kuang;Lu;Hsueh-Hsing;Lin;Yu-Hsin
國立成功大學 2018 Drain-Induced-Barrier-Lowing-Like Effect Induced by Oxygen-Vacancy in Scaling-Down via-Contact Type Amorphous InGaZnO Thin-Film Transistors Yang;Chung-I;Chang;Ting-Chang;Liao;Po-Yung;Chen;Li-Hui;Chen;Bo-Wei;Chou;Wu-Ching;Chen;Guan-Fu;Lin;Sung-Chun;Yeh;Cheng-Yen;Tsai;Cheng-Ming;Yu;Ming-Chang;Zhang;Shengdong

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