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臺灣學術機構典藏系統 (Taiwan Academic Institutional Repository, TAIR)
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Institution Date Title Author
國立交通大學 2020-10-05T02:02:22Z Coupling-Aware Functional Timing Analysis for Tighter Bounds: How Much Margin Can We Relax? Lin, Jack S-Y; Lin, Louis Y-Z; Huang, Ryan H-M; Wen, Charles H-P
國立交通大學 2019-04-02T06:04:51Z Aging-aware Statistical Soft-Error-Rate Analysis for Nano-Scaled CMOS Designs Lin, Cosette Y. H.; Huang, Ryan H. -M.; Wen, Charles H. -P.; Chang, Austin C. -C.
國立交通大學 2017-04-21T06:50:18Z TASSER: A Temperature-Aware Statistical Soft-Error-Rate Analysis Framework for Combinational Circuits Hsueh, Sung S. -Y.; Huang, Ryan H. -M.; Wen, Charles H. -P.
國立交通大學 2017-04-21T06:50:10Z CASTA: CUDA-Accelerated Static Timing Analysis for VLSI Designs Wang, Hunta H. -W.; Lin, Louis Y. -Z.; Huang, Ryan H-M.; Wen, Charles H-P.
國立交通大學 2017-04-21T06:49:13Z TA-FTA: Transition-Aware Functional Timing Analysis with A Four-Valued Encoding Chang, Jasper C. C.; Huang, Ryan H. -M.; Lin, Louis Y. -Z.; Wen, Charles H. -P.
國立交通大學 2015-07-21T08:31:24Z TASSER: A Temperature-Aware Statistical Soft-Error-Rate Analysis Framework for Combinational Circuits Hsueh, Sung S. -Y.; Huang, Ryan H. -M.; Wen, Charles H. -P.
國立交通大學 2015-07-21T08:31:19Z Advanced Soft-Error-Rate (SER) Estimation with Striking-Time and Multi-Cycle Effects Huang, Ryan H-M; Wen, Charles H-P
國立交通大學 2015-07-21T08:30:53Z Suppressing Test Inflation in Shared-Memory Parallel Automatic Test Pattern Generation Ku, Jerry C. Y.; Huang, Ryan H. -M.; Lin, Louis Y. -Z.; Wen, Charles H. -P.
國立交通大學 2015-07-21T08:28:51Z A Determinate Radiation Hardened Technique for Safety-Critical CMOS Designs Huang, Ryan H. -M.; Hsu, Dennis K. -H.; Wen, Charles H. -P.
國立交通大學 2014-12-08T15:33:13Z Aging-aware Statistical Soft-Error-Rate Analysis for Nano-Scaled CMOS Designs Lin, Cosette Y. H.; Huang, Ryan H. -M.; Wen, Charles H. -P.; Chang, Austin C. -C.
國立交通大學 2014-12-08T15:32:22Z CASSER: A Closed-Form Analysis Framework for Statistical Soft Error Rate Chang, Austin C. -C.; Huang, Ryan H. -M.; Wen, Charles H. -P.

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