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"hwang chi hung"的相關文件
顯示項目 1-10 / 18 (共2頁)
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| 臺大學術典藏 |
2019-10-28T03:21:40Z |
A low-level stress measurement method by integrating white light photoelasticity and spectrometry
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Sung, Po-Chi;Wang, Wei-Chung;Hwang, Chi-Hung;Lai, Guan-Ting; Sung, Po-Chi; Wang, Wei-Chung; Hwang, Chi-Hung; Lai, Guan-Ting; WEICHUNG WANG |
| 臺大學術典藏 |
2019-10-28T03:21:25Z |
A low-level stress measurement method by integrating white light photoelasticity and spectrometry
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Sung, Po-Chi;Wang, Wei-Chung;Hwang, Chi-Hung;Lai, Guan-Ting; Sung, Po-Chi; Wang, Wei-Chung; Hwang, Chi-Hung; Lai, Guan-Ting; WEICHUNG WANG |
| 國立交通大學 |
2019-09-02T07:46:16Z |
Real-Time Image-Based Defect Inspection System of Internal Thread for Nut
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Lin, Chun-Fu; Lin, Sheng-Fuu; Hwang, Chi-Hung; Tu, Hao-Kai; Chen, Chih-Yen; Weng, Chun-Jen |
| 國立交通大學 |
2019-04-03T06:47:04Z |
Tunable fiber confocal sensor with LED
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Weng, Chun-Jen; Lan, Tzu-Hsien; Hwang, Chi-Hung; Chu, Nien-Nan; Huang, Chien-Yao; Cheng, Pi-Ying |
| 國立交通大學 |
2018-08-21T05:57:15Z |
Real-time Pitch Diameter Measurement of Internal Thread for Nut using Laser Triangulation
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Lin, Chun-Fu; Hwang, Chi-Hung; Fang, Hong-Ren; Chen, Chih-Yen; Sze, Jyh-Rou |
| 國立交通大學 |
2018-08-21T05:56:22Z |
Measuring the thickness of transparent objects using a confocal displacement sensor
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Weng, Chun-Jen; Lu, Bo-Rong; Cheng, Pi-Ying; Hwang, Chi-Hung; Chen, Chih-Yen |
| 國立交通大學 |
2018-08-21T05:54:27Z |
Light energy transformation over a few nanometers
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Huang, Hung Ji; Liu, Bo-Heng; Su, James; Chen, Po-Jui; Lin, Chun-Ting; Chiang, Hai-Pang; Kao, Tsung Sheng; Chau, Yuan-Fong Chou; Kei, Chi-Chung; Hwang, Chi-Hung |
| 國立交通大學 |
2017-04-21T06:56:49Z |
Manipulating Polycrystalline Silicon Nanowire FET Characteristics by Light Illumination
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Chen, Chien-Hung; Lin, Chih-Heng; Yang, Yuh-Shyong; Hwang, Chi-Hung |
| 國立交通大學 |
2017-04-21T06:49:51Z |
Rapid displacement sensor based on fitting scan
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Ye, Zheng-Jie; Hwang, Chi-Hung; Cheng, Pi-Ying; Chen, Chih-Yen; Weng, Chun-Jen |
| 國立交通大學 |
2017-04-21T06:49:51Z |
Real-time Image Data Acquisition and Inspection System for Integrated Circuit Wafer after Sawing Process
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Lin, Chun-Fu; Fang, Hong-Ren; Sze, Jyh-Rou; Lin, Sheng-Fuu; Hwang, Chi-Hung |
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