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机构 日期 题名 作者
臺大學術典藏 2020-01-13T08:20:48Z Stress effect on the kinetics of silicon thermal oxidation Yen, J. Y.;Hwu, J. G.Jia-Yush Yen; Yen, J. Y.; Hwu, J. G.; JIA-YUSH YEN
臺大學術典藏 2020-01-13T08:20:48Z Enhancement of silicon oxidation rate due to tensile mechanical stress Jia-Yush YenYen, J. Y.;Hwu, J. G.; Yen, J. Y.; Hwu, J. G.; JIA-YUSH YEN
臺大學術典藏 2020-01-13T08:20:47Z Effect of mechanical stress on characteristics of silicon thermal oxides Jia-Yush YenYen, J. Y.;Huang, C. H.;Hwu, J. G.; Yen, J. Y.; Huang, C. H.; Hwu, J. G.; JIA-YUSH YEN
臺大學術典藏 2018-09-10T14:54:17Z Effect of trapped electrons in ultrathin SiO2 on the two-state inversion capacitance at varied frequencies of metal-oxide-semiconductor capacitor Chen, T.-Y.;Hwu, J.-G.; Chen, T.-Y.; Hwu, J.-G.; JENN-GWO HWU
臺大學術典藏 2018-09-10T14:54:17Z Corner induced non-uniform electric field effect on the electrical reliability of metal-oxide-semiconductor devices with non-planar substrates Tseng, P.-H.;Hwu, J.-G.; Tseng, P.-H.; Hwu, J.-G.; JENN-GWO HWU
臺大學術典藏 2018-09-10T14:54:17Z Convex corner induced capacitance-voltage response from depletion to deep depletion in non-planar substrate metal-oxide-semiconductor capacitors with ultra thin oxide Tseng, P.-H.;Hwu, J.-G.; Tseng, P.-H.; Hwu, J.-G.; JENN-GWO HWU
臺大學術典藏 2018-09-10T14:54:17Z Formation of single crystal si-nanowire by electric field self-redistribution effect in anodic oxidation for multilayer array application Tian, W.-C.; Tseng, P.-H.;Tian, W.-C.;Pan, S.C.;Hwu, J.-G.; Tseng, P.-H.; JENN-GWO HWU; Hwu, J.-G.; Pan, S.C.
臺大學術典藏 2018-09-10T14:54:16Z Roles of interface and oxide trap density in the kinked current behavior of Al/SiO2/Si(p) structures with ultra-thin oxides Lu, H.-W.;Hwu, J.-G.; Lu, H.-W.; Hwu, J.-G.; JENN-GWO HWU
臺大學術典藏 2018-09-10T14:54:16Z Role of lateral diffusion current in perimeter-dependent current of MOS(p) tunneling temperature sensors Lin, Y.-K.;Hwu, J.-G.; Lin, Y.-K.; Hwu, J.-G.; JENN-GWO HWU
臺大學術典藏 2018-09-10T14:54:16Z Photosensing by edge schottky barrier height modulation induced by lateral diffusion current in MOS(p) photodiode JENN-GWO HWU; Lin, Y.-K.;Hwu, J.-G.; Lin, Y.-K.; Hwu, J.-G.

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