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机构 日期 题名 作者
國立臺灣大學 2002 Enhanced thermally induced stress effect on an ultrathin gate oxide Su, Jiann-Liang; Hong, Chao-Chi; Hwu, Jenn-Gwo
國立臺灣大學 2002 Silicon Metal-Oxide-Semiconductor Solar Cells with Oxide Prepared by Room Temperature Anodization in Hydrofluosilicic Acid Solution Chen, Chih-Hao; Hong, Chao-Chi; Hwu, Jenn-Gwo
國立臺灣大學 2001-10 Novel ultra thin gate oxide growth technique by alternating current anodization Hwu, Jenn-Gwo; Lee, Chuang-Yuan; Ting, Chieh-Chih; Chen, Wei-Len
臺大學術典藏 2001-10 Novel ultra thin gate oxide growth technique by alternating current anodization Hwu, Jenn-Gwo; Lee, Chuang-Yuan; Ting, Chieh-Chih; Chen, Wei-Len; Hwu, Jenn-Gwo; Lee, Chuang-Yuan; Ting, Chieh-Chih; Chen, Wei-Len
國立臺灣大學 2001 Ultra-thin gate oxides prepared by alternating current anodization of silicon followed by rapid thermal anneal Chen, Yung-Chieh; Lee, Chuang-Yuan; Hwu, Jenn-Gwo
國立臺灣大學 2001 Stress Effect on the Kinetics of Silicon Thermal Oxidation Yen, Jui-Yuan; Hwu, Jenn-Gwo
國立臺灣大學 2001 Anomalous low-voltage tunneling current characteristics of ultrathin gate oxide (~2 nm) after high-field stress Huang, Chia-Hong; Hwu, Jenn-Gwo
國立臺灣大學 2001 An on-Chip Temperature Sensor by Utilizing a MOS Tunneling Diode Shih, Yen-Hao; Hwu, Jenn-Gwo
國立臺灣大學 2001 Improvement in oxide thickness uniformity by repeated spikeoxidation Hong, Chao-Chi; Lee, Chuang-Yuan; Hsieh, Yuan-Long; Liu, Chean-Chung; Fong, I.-K.; Hwu, Jenn-Gwo
國立臺灣大學 2001 Breakdown characteristics of ultrathin gate oxides (<4 nm) in metal–oxide–semiconductor structure subjected to substrate injection Huang, Chia-Hong; Hwu, Jenn-Gwo

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