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Taiwan Academic Institutional Repository >
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"hwu jenn gwo"
Showing items 16-25 of 210 (21 Page(s) Totally)
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| 臺大學術典藏 |
2009-04-27T07:11:26Z |
Radiation Effects on the Oxide Properties of Silicon MOS Capacitor
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胡振國;Lee, G. S.;Jeng, M. J.;王維新;李嗣涔; Hwu, Jenn-Gwo;Lee, G. S.;Jeng, M. J.;Wang, Way-Seen;Lee, Si-Chen; 胡振國; Lee, G. S.; Jeng, M. J.; 王維新; 李嗣涔; Hwu, Jenn-Gwo; Lee, G. S.; Jeng, M. J.; Wang, Way-Seen; Lee, Si-Chen |
| 臺大學術典藏 |
2009-04-27T04:28:29Z |
Radiation Hardness of Coplanar Submicron Gap Charge-Coupled Devices (CCD) with Rapid Thermal Nitrided Oxides
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Lee, G. C.; Hwu, Jenn-Gwo; Lee, G. C.; 胡振國; Lee, G. C.; Hwu, Jenn-Gwo; Lee, G. C. |
| 臺大學術典藏 |
2009-04-27T04:27:06Z |
Radiation Hardness of Coplanar Submicron Gap Charge-Coupled Devices (CCD) with Rapid Thermal Nitrided Oxides
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Hwu, Jenn-Gwo; Lee, K. C.; 胡振國; Lee, K. C.; Hwu, Jenn-Gwo; Lee, K. C. |
| 臺大學術典藏 |
2009-02-24T03:49:30Z |
Clockwise C-V Hysteresis Phenomena of Metal-Tantalum Oxide-Silicon-Oxide-Silicon(P) Capacitors Due to Leakage Current Through Tantalum Oxide
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Tu, Y. K.; Wang, Way-Seen; Hwu, Jenn-Gwo; Hwu, Jenn-Gwo; Wang, Way-Seen; Tu, Y. K.; Jeng, M. J.; 胡振國; Jeng, M. J.; 王維新; Tu, Y. K. |
| 國立臺灣大學 |
2009 |
Thin Silicon Oxide Films on N-type 4H-SiC Prepared by Scanning Frequency Anodization Method
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Chuang, Kai-Chieh; Hwu, Jenn-Gwo |
| 國立臺灣大學 |
2009 |
Comprehensive study on the deep depletion capacitance-voltage behavior for metal-oxide-semiconductor capacitor with ultrathin oxides
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Cheng, Jen-Yuan; Huang, Chiao-Ti; Hwu, Jenn-Gwo |
| 國立臺灣大學 |
2009 |
Characteraization of Stacked Hafnium Oxide (HfO2)/Silicon Dioxide (SiO2) Metal-Oxide-Semiconductor (MOS) Tunneling Temperature Sensors
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Wang, Chih-Yao; Hwu, Jenn-Gwo |
| 國立臺灣大學 |
2009 |
Comparison of Lateral Non-uniformity Phenomena between HfO2 and SiO2 from Magnified C-V Curves in Inversion Region
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Cheng, Jen-Yuan; Huang, Chiao-Ti; Hwu, Jenn-Gwo |
| 國立臺灣大學 |
2009 |
Low Temperature Tandem Aluminum Oxides Prepared by DAC-ANO Compensation in Nitric Acid
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Yang, Che-Yu; Hwu, Jenn-Gwo |
| 國立臺灣大學 |
2009 |
Characterization of Inversion Tunneling Current Saturation Behavior for MOS(p) Capacitors with Ultra-thin Oxides and High-k Dielectrics
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Chen, Chih-Hao; Chuang, Kai-Chieh; Hwu, Jenn-Gwo |
Showing items 16-25 of 210 (21 Page(s) Totally)
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