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Taiwan Academic Institutional Repository >
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"ikiri y"
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| 國立臺灣科技大學 |
2020 |
Temperature Sensing with a Relaxation Oscillator in CMOS ICs
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Sako, F.;Ikiri, Y.;Hashizume, M.;Yotsuyanagi, H.;Yokoyama, H.;Lu, S.-K. |
| 國立臺灣科技大學 |
2020 |
Temperature Sensing with a Relaxation Oscillator in CMOS ICs
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Sako, F.;Ikiri, Y.;Hashizume, M.;Yotsuyanagi, H.;Yokoyama, H.;Lu, S.-K. |
| 國立臺灣科技大學 |
2016 |
Electrical interconnect test of solder joint part with boundary scan flip flops and a built-in test circuit
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Hashizume, M;Ikiri, Y;Konishi, T;Yotsuyanagi, H;Lu, S.-K. |
| 國立臺灣科技大學 |
2016 |
Testability for resistive open defects by electrical interconnect test of 3D ICs without boundary scan flip flops
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Ali, F.A.B;Hashizume, M;Ikiri, Y;Yotsuyanagi, H;Lu, S.-K. |
| 國立臺灣科技大學 |
2015 |
Electrical interconnect test method of 3D ICs without boundary scan flip flops
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Hashizume, M;Umezu, S;Ikiri, Y;Ali, F.A.B;Yotsuyanagi, H;Lu, S.-K. |
Showing items 1-5 of 5 (1 Page(s) Totally)
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