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臺灣學術機構典藏系統 (Taiwan Academic Institutional Repository, TAIR)
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Showing items 146-155 of 176  (18 Page(s) Totally)
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Institution Date Title Author
臺大學術典藏 2018-09-10T04:35:19Z Compact Modeling of SOI CMOS VLSI Devices J. .B. Kuo; JAMES-B KUO
臺大學術典藏 2018-09-10T04:35:19Z Asymmetric Gate Misalignment Effect on Subthreshold Characteristics DG SOI NMOS Devices Considering Fringing Electric Field Effect M. T. Lin; E. C. Sun; J. B. Kuo; JAMES-B KUO
臺大學術典藏 2018-09-10T04:35:18Z Ultra-low-voltage SOI CMOS Inverting Driver Circuit Using Effective Charge Pump Based on Bootstrap Technique JAMES-B KUO; J. B. Kuo; J. H. T. Chen
臺大學術典藏 2018-09-10T04:35:18Z Modeling the Fringing Electric Field Effect on the Threshold Voltage of FD SOI NMOS Devices with the LDD/Sidewall Oxide Spacer Structure S. C. Lin; J. B. Kuo; JAMES-B KUO
臺大學術典藏 2018-09-10T04:35:18Z SOI CMOS VLSI J. B. Kuo; JAMES-B KUO
臺大學術典藏 2018-09-10T04:35:18Z Novel Sub-1V CMOS Domino Dynamic Logic Circuit Using a Direct Bootstrap (DB) Technique for Low-voltage CMOS VLSI P. C. Chen; J. B. Kuo; JAMES-B KUO
臺大學術典藏 2018-09-10T04:35:18Z A Novel 0.8V BP-DTMOS Content Addressable Memory Cell Circuit Derived from SOI-DTMOS Techniques E. Shen; J. B. Kuo; JAMES-B KUO
臺大學術典藏 2018-09-10T04:35:18Z Analysis of Gate Misalignment Effect on the Threshold Voltage of Double-Gate (DG) Ultrathin FD SOI NMOS Devices Using a Compact Model Considering Fringing Electric Field Effect J. B. Kuo; E. C. Sun; M. T. Lin; JAMES-B KUO
臺大學術典藏 2018-09-10T04:15:06Z The Fringing Electric Field Effect on the Short-Channel Effect Threshold Voltage of FD SOI NMOS Devices with LDD/Sidewall Oxide Spacer Structure J. B. Kuo; S. C. Lin; JAMES-B KUO
臺大學術典藏 2018-09-10T04:15:06Z Fringing-Induced Barrier Lowering (FIBL) Effects of 100nm FD SOI NMOS Devices with High Permittivity Gate Dielectrics and LDD/Sidewall Oxide Spacer S. C. Lin; J. B. Kuo; JAMES-B KUO

Showing items 146-155 of 176  (18 Page(s) Totally)
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