臺灣學術機構典藏系統 (Taiwan Academic Institutional Repository, TAIR)

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Institution	Date	Title	Author
臺大學術典藏	2018-09-10T15:00:42Z	GALAXY: A Multi-Circuit Simulator based on Inverse Jacobian Matrix Reuse	H.Y. Lee;C.Y. Han;J. C.-M. Li; H.Y. Lee; C.Y. Han; J. C.-M. Li; CHIEN-MO LI
臺大學術典藏	2018-09-10T15:00:42Z	GALAXY: A Multi-Circuit Simulator based on Inverse Jacobian Matrix Reuse	H.Y. Lee;C.Y. Han;J. C.-M. Li; H.Y. Lee; C.Y. Han; J. C.-M. Li; CHIEN-MO LI
臺大學術典藏	2018-09-10T15:00:42Z	GPU-Based Timing-Aware Test Generation for Small Delay Defects	K.Y. Liao;J. C.-M. Li;M. Hsiao; K.Y. Liao; J. C.-M. Li; M. Hsiao; CHIEN-MO LI
臺大學術典藏	2018-09-10T15:00:42Z	GPU-Based Timing-Aware Test Generation for Small Delay Defects	K.Y. Liao;J. C.-M. Li;M. Hsiao; K.Y. Liao; J. C.-M. Li; M. Hsiao; CHIEN-MO LI
臺大學術典藏	2018-09-10T15:00:41Z	Simultaneous Optimization of Analog Circuits With Reliability and Variability for Applications on Flexible Electronics	Y. L. Chen;W. R. Wu;C. N. J. Liu;J. C. M. Li; Y. L. Chen; W. R. Wu; C. N. J. Liu; J. C. M. Li; CHIEN-MO LI
臺大學術典藏	2018-09-10T15:00:41Z	Simultaneous Optimization of Analog Circuits With Reliability and Variability for Applications on Flexible Electronics	Y. L. Chen;W. R. Wu;C. N. J. Liu;J. C. M. Li; Y. L. Chen; W. R. Wu; C. N. J. Liu; J. C. M. Li; CHIEN-MO LI
臺大學術典藏	2018-09-10T15:00:41Z	Testing of TSV-induced Small Delay Faults for Three Dimensional Integrated Circuits	C.Y. Kuo;C. J. Shih;J. C. M. Li;K. Chakrabarty; C.Y. Kuo; C. J. Shih; J. C. M. Li; K. Chakrabarty; YI-CHANG LU; CHIEN-MO LI
臺大學術典藏	2018-09-10T15:00:41Z	Testing of TSV-induced Small Delay Faults for Three Dimensional Integrated Circuits	C.Y. Kuo;C. J. Shih;J. C. M. Li;K. Chakrabarty; C.Y. Kuo; C. J. Shih; J. C. M. Li; K. Chakrabarty; YI-CHANG LU; CHIEN-MO LI
臺大學術典藏	2018-09-10T09:50:54Z	Compact Test Pattern Selection for Small Delay Defect	J. Y. Chang;K. Y. Liao;S. C. Hsu;J. C. M. Li;J. C. Rau; J. Y. Chang; K. Y. Liao; S. C. Hsu; J. C. M. Li; J. C. Rau; CHIEN-MO LI
臺大學術典藏	2018-09-10T09:50:54Z	Compact Test Pattern Selection for Small Delay Defect	J. Y. Chang;K. Y. Liao;S. C. Hsu;J. C. M. Li;J. C. Rau; J. Y. Chang; K. Y. Liao; S. C. Hsu; J. C. M. Li; J. C. Rau; CHIEN-MO LI

Showing items 11-20 of 76 (8 Page(s) Totally)
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