臺灣學術機構典藏系統 (Taiwan Academic Institutional Repository, TAIR)

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Showing items 26-35 of 76 (8 Page(s) Totally)
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Institution	Date	Title	Author
臺大學術典藏	2018-09-10T09:25:31Z	Thermal-aware Test Schedule and TAM Co-Optimization for Three Dimensional IC	C. J. Shih;C. Y. Hsu;C. Y. Kou;J. C. M. Li;J. C. Rau;K. Chakrabarty; C. J. Shih; C. Y. Hsu; C. Y. Kou; J. C. M. Li; J. C. Rau; K. Chakrabarty; CHIEN-MO LI
臺大學術典藏	2018-09-10T09:25:31Z	Launch-on-Shift Test Generation for Testing Scan Designs Containing Synchronous and Asynchronous Clock Domains,	S. Wu;L. T. Wang;X. Wen;W. B. Jone;M. S. Hsiao;F. Li;J. C. M. Li;J. L. Huang; S. Wu; L. T. Wang; X. Wen; W. B. Jone; M. S. Hsiao; F. Li; J. C. M. Li; J. L. Huang; CHIEN-MO LI; JIUN-LANG HUANG
臺大學術典藏	2018-09-10T09:25:31Z	Launch-on-Shift Test Generation for Testing Scan Designs Containing Synchronous and Asynchronous Clock Domains,	S. Wu;L. T. Wang;X. Wen;W. B. Jone;M. S. Hsiao;F. Li;J. C. M. Li;J. L. Huang; S. Wu; L. T. Wang; X. Wen; W. B. Jone; M. S. Hsiao; F. Li; J. C. M. Li; J. L. Huang; CHIEN-MO LI; JIUN-LANG HUANG
臺大學術典藏	2018-09-10T09:25:31Z	An At-speed Test Technique for High-speed High-order Adder by a 6.4-GHz 64-bit Domino Adder Example	Y. S. Wang;M. H. Hsieh;J. C. M. Li;C. C. P. Chen; Y. S. Wang; M. H. Hsieh; J. C. M. Li; C. C. P. Chen; CHIEN-MO LI
臺大學術典藏	2018-09-10T09:25:31Z	An At-speed Test Technique for High-speed High-order Adder by a 6.4-GHz 64-bit Domino Adder Example	Y. S. Wang;M. H. Hsieh;J. C. M. Li;C. C. P. Chen; Y. S. Wang; M. H. Hsieh; J. C. M. Li; C. C. P. Chen; CHIEN-MO LI
臺大學術典藏	2018-09-10T09:25:31Z	Transient IR-drop Analysis for At-speed Testing Using Representative Random Walk,	M. H. Tsai;W. S. Ting;J. C. M. Li; M. H. Tsai; W. S. Ting; J. C. M. Li; CHIEN-MO LI
臺大學術典藏	2018-09-10T09:25:31Z	Transient IR-drop Analysis for At-speed Testing Using Representative Random Walk,	M. H. Tsai;W. S. Ting;J. C. M. Li; M. H. Tsai; W. S. Ting; J. C. M. Li; CHIEN-MO LI
臺大學術典藏	2018-09-10T09:25:31Z	GPU-Based Massively Parallel N-Detect Transition Delay Fault ATPG,	K. Y. Liao; S. C. Hsu; J. C. M. Li; CHIEN-MO LI
臺大學術典藏	2018-09-10T09:25:31Z	Multi-Mode Automatic Test Pattern Generation for Dynamic Voltage and Frequency Scaling Designs	B. C. Bai;J. C. M. Li; B. C. Bai; J. C. M. Li; CHIEN-MO LI
臺大學術典藏	2018-09-10T09:25:31Z	Multi-Mode Automatic Test Pattern Generation for Dynamic Voltage and Frequency Scaling Designs	B. C. Bai;J. C. M. Li; B. C. Bai; J. C. M. Li; CHIEN-MO LI

Showing items 26-35 of 76 (8 Page(s) Totally)
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