臺灣學術機構典藏系統 (Taiwan Academic Institutional Repository, TAIR)

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Institution	Date	Title	Author
臺大學術典藏	2018-09-10T08:19:09Z	DFT and Minimum Leakage Pattern Generation for Static Power Reduction During Test and Burn-in	W.-C. Kao;W.-S. Chuang;H.-T. Lin;J. C.-M. Li;V, Manquinho; W.-C. Kao; W.-S. Chuang; H.-T. Lin; J. C.-M. Li; V, Manquinho; CHIEN-MO LI
臺大學術典藏	2018-09-10T07:43:08Z	Fault Modeling and Testing of Retention Flip-Flops in Low Power Designs	B. C. Bai;A. K Li;J. C.M. Li;K. C. Wu; B. C. Bai; A. K Li; J. C.M. Li; K. C. Wu; CHIEN-MO LI
臺大學術典藏	2018-09-10T07:43:08Z	Fault Modeling and Testing of Retention Flip-Flops in Low Power Designs	B. C. Bai;A. K Li;J. C.M. Li;K. C. Wu; B. C. Bai; A. K Li; J. C.M. Li; K. C. Wu; CHIEN-MO LI
臺大學術典藏	2018-09-10T07:43:08Z	BIST Design Optimization for Large-Scale Embedded Memory Cores	T.-F. Chien;W.-C. Chao;J. C.-M. Li;K.-Y. Liao;Y.-W. Chang;M.-T. Chang;M.-H. Tsai;C.-M. Tseng; T.-F. Chien; W.-C. Chao; J. C.-M. Li; K.-Y. Liao; Y.-W. Chang; M.-T. Chang; M.-H. Tsai; C.-M. Tseng; CHIEN-MO LI
臺大學術典藏	2018-09-10T07:43:08Z	BIST Design Optimization for Large-Scale Embedded Memory Cores	T.-F. Chien;W.-C. Chao;J. C.-M. Li;K.-Y. Liao;Y.-W. Chang;M.-T. Chang;M.-H. Tsai;C.-M. Tseng; T.-F. Chien; W.-C. Chao; J. C.-M. Li; K.-Y. Liao; Y.-W. Chang; M.-T. Chang; M.-H. Tsai; C.-M. Tseng; CHIEN-MO LI
臺大學術典藏	2018-09-10T07:43:08Z	Electronic Design Automation	J. C.-M. Li;M. Hsiao; J. C.-M. Li; M. Hsiao; CHIEN-MO LI
臺大學術典藏	2018-09-10T07:43:08Z	Electronic Design Automation	J. C.-M. Li;M. Hsiao; J. C.-M. Li; M. Hsiao; CHIEN-MO LI
臺大學術典藏	2018-09-10T07:43:07Z	Very-Low-Voltage Testing of Amorphous Silicon TFT Circuits	Shiue-Tsung Shen,;Wei-Hsiao Liu,;En-Hua Ma,;J. C.-M. Li,;I-Chun Cheng,; Shiue-Tsung Shen,; Wei-Hsiao Liu,; En-Hua Ma,; J. C.-M. Li,; I-Chun Cheng,; I-CHUN CHENG; CHIEN-MO LI
臺大學術典藏	2018-09-10T07:43:07Z	Very-Low-Voltage Testing of Amorphous Silicon TFT Circuits	Shiue-Tsung Shen,;Wei-Hsiao Liu,;En-Hua Ma,;J. C.-M. Li,;I-Chun Cheng,; Shiue-Tsung Shen,; Wei-Hsiao Liu,; En-Hua Ma,; J. C.-M. Li,; I-Chun Cheng,; I-CHUN CHENG; CHIEN-MO LI
臺大學術典藏	2018-09-10T07:43:06Z	Time-space test response compaction and diagnosis based on BCH codes	F. M. Wang;W.-C. Wang;J. C-M. Li; F. M. Wang; W.-C. Wang; J. C-M. Li; CHIEN-MO LI

Showing items 46-55 of 76 (8 Page(s) Totally)
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