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Showing items 6-15 of 76  (8 Page(s) Totally)
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Institution Date Title Author
臺大學術典藏 2018-09-10T15:00:42Z Physical-aware Systematic Multiple Defect Diagnosis P. J. Chen;C. C. Che;J. C. M. Li;S. F. Kuo;P. Y. Hsueh;C. Y. Kuo;J. N. Lee; P. J. Chen; C. C. Che; J. C. M. Li; S. F. Kuo; P. Y. Hsueh; C. Y. Kuo; J. N. Lee; CHIEN-MO LI
臺大學術典藏 2018-09-10T15:00:42Z Detect RRAM Defects in The Early Stage During Rnv8T Nonvolatile SRAM Testing B.C. Bai;C.A. Chen;J C.M Li; B.C. Bai; C.A. Chen; J C.M Li; CHIEN-MO LI
臺大學術典藏 2018-09-10T15:00:42Z Detect RRAM Defects in The Early Stage During Rnv8T Nonvolatile SRAM Testing B.C. Bai;C.A. Chen;J C.M Li; B.C. Bai; C.A. Chen; J C.M Li; CHIEN-MO LI
臺大學術典藏 2018-09-10T15:00:42Z Power-Supply-Noise-Aware Dynamic Timing Analyzer for 3D IC H.Y. Hsieh;J. C.-M. Li; H.Y. Hsieh; J. C.-M. Li; CHIEN-MO LI
臺大學術典藏 2018-09-10T15:00:42Z Power-Supply-Noise-Aware Dynamic Timing Analyzer for 3D IC H.Y. Hsieh;J. C.-M. Li; H.Y. Hsieh; J. C.-M. Li; CHIEN-MO LI
臺大學術典藏 2018-09-10T15:00:42Z GALAXY: A Multi-Circuit Simulator based on Inverse Jacobian Matrix Reuse H.Y. Lee;C.Y. Han;J. C.-M. Li; H.Y. Lee; C.Y. Han; J. C.-M. Li; CHIEN-MO LI
臺大學術典藏 2018-09-10T15:00:42Z GALAXY: A Multi-Circuit Simulator based on Inverse Jacobian Matrix Reuse H.Y. Lee;C.Y. Han;J. C.-M. Li; H.Y. Lee; C.Y. Han; J. C.-M. Li; CHIEN-MO LI
臺大學術典藏 2018-09-10T15:00:42Z GPU-Based Timing-Aware Test Generation for Small Delay Defects K.Y. Liao;J. C.-M. Li;M. Hsiao; K.Y. Liao; J. C.-M. Li; M. Hsiao; CHIEN-MO LI
臺大學術典藏 2018-09-10T15:00:42Z GPU-Based Timing-Aware Test Generation for Small Delay Defects K.Y. Liao;J. C.-M. Li;M. Hsiao; K.Y. Liao; J. C.-M. Li; M. Hsiao; CHIEN-MO LI
臺大學術典藏 2018-09-10T15:00:41Z Simultaneous Optimization of Analog Circuits With Reliability and Variability for Applications on Flexible Electronics Y. L. Chen;W. R. Wu;C. N. J. Liu;J. C. M. Li; Y. L. Chen; W. R. Wu; C. N. J. Liu; J. C. M. Li; CHIEN-MO LI

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