臺灣學術機構典藏系統 (Taiwan Academic Institutional Repository, TAIR)

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Showing items 56-65 of 76 (8 Page(s) Totally)
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Institution	Date	Title	Author
臺大學術典藏	2018-09-10T07:43:06Z	Time-space test response compaction and diagnosis based on BCH codes	F. M. Wang;W.-C. Wang;J. C-M. Li; F. M. Wang; W.-C. Wang; J. C-M. Li; CHIEN-MO LI
臺大學術典藏	2018-09-10T07:43:06Z	Bridging Fault Diagnosis to Identify the Layer of Systematic Defects	B. R. Chen;J. C.M. Li; B. R. Chen; J. C.M. Li; CHIEN-MO LI
臺大學術典藏	2018-09-10T07:43:06Z	Bridging Fault Diagnosis to Identify the Layer of Systematic Defects	B. R. Chen;J. C.M. Li; B. R. Chen; J. C.M. Li; CHIEN-MO LI
臺大學術典藏	2018-09-10T07:09:34Z	Phase Noise Testing of Single Chip TV Tuners,	P.-C. Lin; C.-H. Hsu; J. C.-M. Li; C.-M. Chiang; C.-J. Pan,; CHIEN-MO LI
臺大學術典藏	2018-09-10T07:09:34Z	An Asynchronous DFT Technique for TFT Macroelectronics	C. H. Cheng; C.-H. Hsu; J. C.M. Li; CHIEN-MO LI
臺大學術典藏	2018-09-10T07:09:34Z	A Dual-rail Asynchronous Scan Chain Design and Its Implementation in TFT Technology	C. H. Cheng; J. C.M. Li; CHIEN-MO LI
臺大學術典藏	2018-09-10T07:09:34Z	Transition Fault Diagnosis Using At-speed Scan Patterns with Multiple Capture Clocks	Shang-Feng Chao;J. C.-M. Li; Shang-Feng Chao; J. C.-M. Li; CHIEN-MO LI
臺大學術典藏	2018-09-10T07:09:34Z	Transition Fault Diagnosis Using At-speed Scan Patterns with Multiple Capture Clocks	Shang-Feng Chao;J. C.-M. Li; Shang-Feng Chao; J. C.-M. Li; CHIEN-MO LI
臺大學術典藏	2018-09-10T07:09:33Z	Simultaneous capture and shift power reduction test pattern generator for scan testing	CHIEN-MO LI; J. C.M. Li; H.T. Lin
臺大學術典藏	2018-09-10T07:09:32Z	Effective and Economic Phase Noise Testing for Single-Chip TV Tuners	J. C.-M. Li; P.-C. Lin; P.-C. Chiang; C.-M. Pan; C.W. Tseng; CHIEN-MO LI

Showing items 56-65 of 76 (8 Page(s) Totally)
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