English  |  正體中文  |  简体中文  |  0  
???header.visitor??? :  52367221    ???header.onlineuser??? :  939
???header.sponsordeclaration???
 
臺灣學術機構典藏系統 (Taiwan Academic Institutional Repository, TAIR)
???ui.leftmenu.abouttair???

???ui.leftmenu.bartitle???

???index.news???

???ui.leftmenu.copyrighttitle???

???ui.leftmenu.link???

"j i lu"???jsp.browse.items-by-author.description???

???jsp.browse.items-by-author.back???
???jsp.browse.items-by-author.order1??? ???jsp.browse.items-by-author.order2???

Showing items 1-4 of 4  (1 Page(s) Totally)
1 
View [10|25|50] records per page

Institution Date Title Author
臺大學術典藏 2018-09-10T07:41:37Z Shallow Trench Isolated-Related Narrow Channel Effect on Kink Effect and Breakdown Behavior of 40nm PD SOI NMOS Device J. I. Lu;H. J. Hung;J. B. Kuo;D. Chen;C. S. Yeh;C. T. Tsai; J. I. Lu; H. J. Hung; J. B. Kuo; D. Chen; C. S. Yeh; C. T. Tsai; JAMES-B KUO
臺大學術典藏 2018-09-10T07:41:37Z Floating-body-effect-related gate tunneling leakage current phenomenon of 40nm PD SOI NMOS device H. J. Hung;J. I. Lu;J. B. Kuo;D. Chen;C. S. Yeh; H. J. Hung; J. I. Lu; J. B. Kuo; D. Chen; C. S. Yeh; JAMES-B KUO
臺大學術典藏 2018-09-10T07:08:19Z STI Mechanical-Stress Induced Small-Geometry Effect on Hysteresis Phenomenon of 40nm PD SOI NMOS Device H. J. Hung;J. I. Lu;J. B. Kuo;G. S. Lin;C. S. Yeh;C. T. Tsai;M. Ma; H. J. Hung; J. I. Lu; J. B. Kuo; G. S. Lin; C. S. Yeh; C. T. Tsai; M. Ma; JAMES-B KUO
佛光大學 2005 生命力指標之動態管理研究--以電子商務企業為例 梁馨科;呂芝熒; Liang, S.K.; J.I. Lu

Showing items 1-4 of 4  (1 Page(s) Totally)
1 
View [10|25|50] records per page