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| 臺大學術典藏 |
2018-09-10T14:54:52Z |
Defect study of GaN based LED structure by electron beam induced current
|
Grinys, T.;Jelmakas, E.;Reklaitis, I.;Lapinskas, S.;Kadys, A.;Malinauskas, T.;Lin, C.-H.;Yang, C.-C.;Toma?iunas, R.; Grinys, T.; Jelmakas, E.; Reklaitis, I.; Lapinskas, S.; Kadys, A.; Malinauskas, T.; Lin, C.-H.; Yang, C.-C.; Toma?iunas, R.; CHIH-CHUNG YANG |
| 臺大學術典藏 |
2018-09-10T14:54:52Z |
Defect study of GaN based LED structure by electron beam induced current
|
Grinys, T.;Jelmakas, E.;Reklaitis, I.;Lapinskas, S.;Kadys, A.;Malinauskas, T.;Lin, C.-H.;Yang, C.-C.;Toma?iunas, R.; Grinys, T.; Jelmakas, E.; Reklaitis, I.; Lapinskas, S.; Kadys, A.; Malinauskas, T.; Lin, C.-H.; Yang, C.-C.; Toma?iunas, R.; CHIH-CHUNG YANG |
Showing items 1-2 of 2 (1 Page(s) Totally)
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