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Institution Date Title Author
國立交通大學 2014-12-12T02:25:33Z 超薄閘極氧化層退化機制之完整研究 康定國; Kang, Ting-Kuo; 陳明哲; Chen, Ming-Jer
國立成功大學 2009-04 Study of Enhanced Impact Ionization in Strained-SiGe p-Channel Metal-Oxide-Semiconductor Field-Effect Transistors Huang, Po-Chin; Kang, Ting-Kuo; Wang, Bo-Chin; Wu, San-Lein; Chang, Shoou-Jinn
國立成功大學 2008-04 Investigation of impact ionization in strained-Si n-channel metal-oxide-semiconductor field-effect transistors Kang, Ting-Kuo; Huang, Po-Chin; Sa, Yu-Huan; Wu, San-Lein; Chang, Shoou-Jinn
國立成功大學 2007-05 Impact of SiN on performance in novel complementary metal-oxide-semiconductor architecture using substrate strained-SiGe and mechanical strained-Si technology Lin, Chung-Hsiung; Wu, San-Lein; Wu, Chung-Yi; Kang, Ting-Kuo; Huang, Kuang-Chih; Chang, Shoou-Jinn
大葉大學 1996-06 A novel method for determining the threshold vltage of MOSFET devices Kang, Ting-Kuo;Chen, Shen-Li;Lee, Shihfong;Chu, Sheng-Yeun

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