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| 國立交通大學 |
2014-12-12T02:25:33Z |
超薄閘極氧化層退化機制之完整研究
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康定國; Kang, Ting-Kuo; 陳明哲; Chen, Ming-Jer |
| 國立成功大學 |
2009-04 |
Study of Enhanced Impact Ionization in Strained-SiGe p-Channel Metal-Oxide-Semiconductor Field-Effect Transistors
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Huang, Po-Chin; Kang, Ting-Kuo; Wang, Bo-Chin; Wu, San-Lein; Chang, Shoou-Jinn |
| 國立成功大學 |
2008-04 |
Investigation of impact ionization in strained-Si n-channel metal-oxide-semiconductor field-effect transistors
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Kang, Ting-Kuo; Huang, Po-Chin; Sa, Yu-Huan; Wu, San-Lein; Chang, Shoou-Jinn |
| 國立成功大學 |
2007-05 |
Impact of SiN on performance in novel complementary metal-oxide-semiconductor architecture using substrate strained-SiGe and mechanical strained-Si technology
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Lin, Chung-Hsiung; Wu, San-Lein; Wu, Chung-Yi; Kang, Ting-Kuo; Huang, Kuang-Chih; Chang, Shoou-Jinn |
| 大葉大學 |
1996-06 |
A novel method for determining the threshold vltage of MOSFET devices
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Kang, Ting-Kuo;Chen, Shen-Li;Lee, Shihfong;Chu, Sheng-Yeun |
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