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Showing items 1-4 of 4 (1 Page(s) Totally) 1 View [10|25|50] records per page
| 臺大學術典藏 |
2022-09-21T23:30:33Z |
Fine-Pitch 30 μm Cu-Cu Bonding by Using Low Temperature Microfluidic Electroless Interconnection
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YUNG-SHENG LIN; Hung, Yun Ching; Kao, Chin Li; Lai, Chung Hung; Shih, Po Shao; Huang, Jeng Hau; Tarng, David; C. ROBERT KAO |
| 國立成功大學 |
2018-05-15 |
覆晶封裝電遷移可靠度之電熱耦合分析
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高金利; Kao, Chin-Li |
| 國立成功大學 |
2018-05-15 |
覆晶封裝電遷移可靠度之電熱耦合分析
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高金利; Kao, Chin-Li |
| 國立成功大學 |
2014-11 |
Investigation of electromigration reliability of redistribution lines in wafer-level chip-scale packages
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Kao, Chin-Li; Chen, Tei-Chen; Lai, Yi-Shao; Chiu, Ying-Ta |
Showing items 1-4 of 4 (1 Page(s) Totally) 1 View [10|25|50] records per page
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