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Showing items 1-3 of 3 (1 Page(s) Totally) 1 View [10|25|50] records per page
| 國立成功大學 |
2016-08-16 |
Effect of annealing temperature on electrical and reliability characteristics of HfO2/porous low-k dielectric stacks
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Cheng, Yi-Lung; Kao, Kai-Chieh; Chen, Giin-Shan; Fang, Jau-Shiung; Sun, Chung-Ren; Lee, Wen-Hsi |
| 國立交通大學 |
2015-07-21T11:20:43Z |
Effect of UV curing time on physical and electrical properties and reliability of low dielectric constant materials
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Kao, Kai-Chieh; Chang, Wei-Yuan; Chang, Yu-Min; Leu, Jihperng; Cheng, Yi-Lung |
| 國立暨南國際大學 |
2014 |
多孔隙低介電材料可靠度之研究
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高楷傑; Kao, Kai-Chieh |
Showing items 1-3 of 3 (1 Page(s) Totally) 1 View [10|25|50] records per page
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