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臺灣學術機構典藏系統 (Taiwan Academic Institutional Repository, TAIR)
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Institution Date Title Author
國立成功大學 2016-08-16 Effect of annealing temperature on electrical and reliability characteristics of HfO2/porous low-k dielectric stacks Cheng, Yi-Lung; Kao, Kai-Chieh; Chen, Giin-Shan; Fang, Jau-Shiung; Sun, Chung-Ren; Lee, Wen-Hsi
國立交通大學 2015-07-21T11:20:43Z Effect of UV curing time on physical and electrical properties and reliability of low dielectric constant materials Kao, Kai-Chieh; Chang, Wei-Yuan; Chang, Yu-Min; Leu, Jihperng; Cheng, Yi-Lung
國立暨南國際大學 2014 多孔隙低介電材料可靠度之研究 高楷傑; Kao, Kai-Chieh

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