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Showing items 1-19 of 19 (1 Page(s) Totally)
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| 國立交通大學 |
2017-04-21T06:50:15Z |
A New Variation Plot to Examine the Interfacial-dipole Induced Work-function Variation in Advanced High-k Metal-gate CMOS Devices
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Hsieh, E. R.; Wang, Y. D.; Chung, Steve S.; Ke, J. C.; Yang, C. W.; Hsu, S. |
| 國立交通大學 |
2017-04-21T06:50:00Z |
The Experimental Demonstration of the BTI-Induced Breakdown Path in 28nm High-k Metal Gate Technology CMOS Devices
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Hsieh, E. R.; Lu, P. Y.; Chung, Steve S.; Chang, K. Y.; Liu, C. H.; Ke, J. C.; Yang, C. W.; Tsai, C. T. |
| 國立交通大學 |
2017-04-21T06:49:47Z |
The RTN Measurement Technique on Leakage Path Finding in Advanced High-k Metal Gate CMOS Devices
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Hsieh, E. R.; Lu, P. Y.; Chung, Steve S.; Ke, J. C.; Yang, C. W.; Tsai, C. T.; Yew, T. R. |
| 國立交通大學 |
2017-04-21T06:48:18Z |
The Demonstration of Low-cost and Logic Process Fully-Compatible OTP Memory on Advanced HKMG CMOS with a Newly found Dielectric Fuse Breakdown
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Hsieh, E. R.; Huang, Z. H.; Chung, Steve S.; Ke, J. C.; Yang, C. W.; Tsai, C. T.; Yew, T. R. |
| 國立成功大學 |
2017 |
Statistical inference for the availability of repairable system with general repair, reboot delay, and switching railure
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Liu, T.-H.;Ke, J.-C.;Yen, M.-F.;Hsu, Y.-L. |
| 國立成功大學 |
2017 |
The effect of solvents on the performance of CH3NH3PbI3 perovskite solar cells
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Huang, P.-H.;Wang, Y.-H.;Ke, J.-C.;Huang, C.-J. |
| 國立成功大學 |
2017 |
Effect of temperature annealing treatments and acceptors in CH3NH3PbI3 perovskite solar cell fabrication
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Ke, J.-C.;Wang, Y.-H.;Chen, K.-L.;Huang, C.-J. |
| 國立交通大學 |
2015-12-02T03:00:54Z |
The Observation of BTI-induced RTN Traps in Inversion and Accumulation Modes on HfO2 High-k Metal Gate 28nm CMOS Devices
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Wu, P. C.; Hsieh, E. R.; Lu, P. Y.; Chung, Steve S.; Chang, K. Y.; Liu, C. H.; Ke, J. C.; Yang, C. W.; Tsai, C. T. |
| 國立臺灣科技大學 |
2015 |
Extended preventive replacement policy for a two-unit system subject to damage shocks
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Sheu, S.-H.;Liu, T.-H.;Zhang, Z.G.;Ke, J.-C. |
| 國立臺灣科技大學 |
2014 |
Reliability-based measures for a retrial system with mixed standby components
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Kuo, C.-C.;Sheu, S.-H.;Ke, J.-C.;Zhang, Z.G. |
| 國立臺灣科技大學 |
2014 |
Reliability-based measures for a retrial system with mixed standby components
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Kuo, C.-C.;Sheu, S.-H.;Ke, J.-C.;Zhang, Z.G. |
| 國立臺灣科技大學 |
2013 |
Availability of a repairable retrial system with warm standby components
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Ke, J.-C.;Yang, D.-Y.;Sheu, S.-H.;Kuo, C.-C. |
| 國立臺灣科技大學 |
2008 |
Estimation comparison on busy period for a controllable M/G/1 system with bicriterion policy
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Ke, J.-C.;Ko, M.Y.;Sheu, S.-H. |
| 國立成功大學 |
2004-04 |
Nitride-based LEDs with an SPS Tunneling contact layer and an ITO transparent contact
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Chang, Shoou-Jinn; Chang, C. S.; Su, Yan-Kuin; Chuang, Ricky Wenkuei; Lai, W. C.; Kuo, C. H.; Hsu, Y. P.; Lin, Y. C.; Shei, Shih-Chang; Lo, H. M.; Ke, J. C.; Sheu, Jinn-Kong |
| 國立成功大學 |
2004-03 |
Nitride-based LEDs with textured side walls
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Chang, C. S.; Chang, Shoou-Jinn; Su, Yan-Kuin; Lee, Ching-Ting; Lin, Y. C.; Lai, W. C.; Shei, Shih-Chang; Ke, J. C.; Lo, H. M. |
| 國立成功大學 |
2003-11 |
High brightness InGaN green LEDs with an ITO on n(++)-SPS upper contact
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Chang, C. S.; Chang, Shoou-Jinn; Su, Yan-Kuin; Chih, Hungih-Hung; Lai, W. C.; Lin, Y. C.; Hsu, Y. P.; Shei, Shih-Chang; Tsai, J. M.; Lo, H. M.; Ke, J. C.; Shen, J. K. |
| 國立成功大學 |
2003-11 |
Highly reliable nitride-based LEDs with SPS plus ITO upper contacts
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Chang, Shoou-Jinn; Chang, C. S.; Su, Yan-Kuin; Chuang, R. W.; Lin, Y. C.; Shei, Shih-Chang; Lo, H. M.; Lin, H. Y.; Ke, J. C. |
| 國立成功大學 |
2003-09 |
Nitride-based LEDs fabricated on patterned sapphire substrates
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Chang, Shoou-Jinn; Lin, Y. C.; Su, Yan-Kuin; Chang, C. S.; Wen, Ten-Chin; Shei, Shih-Chang; Ke, J. C.; Kuo, C. W.; Chen, S. C.; Liu, C. H. |
| 國立成功大學 |
2003-09 |
High power nitride based light emitting diodes with Ni/ITO p-type contacts
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Lin, Y. C.; Chang, Shoou-Jinn; Su, Yan-Kuin; Chang, C. S.; Shei, Shih-Chang; Ke, J. C.; Lo, H. M.; Chen, S. C.; Kuo, C. W. |
Showing items 1-19 of 19 (1 Page(s) Totally)
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