臺灣學術機構典藏系統 (Taiwan Academic Institutional Repository, TAIR)

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臺灣學術機構典藏系統 (Taiwan Academic Institutional Repository, TAIR)

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	2019臺灣學術機構典藏研討會
	機構典藏系統RC7版本已發佈

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Institution	Date	Title	Author
國立成功大學	2024-04-1	Impact of Dual-Gate Configuration on the Endurance of Ferroelectric Thin-Film Transistors With Nanosheet Polycrystalline-Silicon Channel Film	Ma;William, Cheng-Yu;Su;Chun-Jung;Kao;Kuo-Hsing;Cho;Ta-Chun;Guo;Jing-Qiang;Wu;Cheng-Jun;Wu;Po-Ying;Hung;Jia-Yuan
國立成功大學	2024	Numerical Simulations of Gate-Granularity- Induced Subthreshold Characteristics Deterioration of MOSFETs Magnified at Cryogenic Temperatures	Kao;Kuo-Hsing;Wang;Zong-Hong;Pai;Yu-Chia;Cheng;Chen-Chi;Lu;Darsen, Darsen D.;Lee;Wen-Jay;Chen;Nan-Yow
國立成功大學	2023-01-13	Device simulations with A U-Net model predicting physical quantities in two-dimensional landscapes	Lee;Wen-Jay;Hsieh;Wu-Tsung;Fang;Bin-Horn;Kao;Kuo-Hsing;Chen;Nan-Yow
國立成功大學	2022-10	Impacts of material parameters on breakdown voltage and location for power MOSFETs	Kumar;Kunal;Lo;Chun-Hsiang;Chang;Chun-Chun;Wu;Tian-Li;Kao;Kuo-Hsing;Wang;Yeong-Her
國立成功大學	2021-01	Inherent Dipole Layer Formation Driven by Surface Energy at Nonplanar Dielectric Interface	Fang;Yu;Lee;Wen-Jay;Yang;An-Chen;Chen;Guan-Peng;Chen;Nan-Yow;Kao;Kuo-Hsing
國立成功大學	2020-	Subthreshold Swing Saturation of Nanoscale MOSFETs Due to Source-to-Drain Tunneling at Cryogenic Temperatures	Kao;Kuo-Hsing;Wu;Rang, Tzung;Chen;Hong-Lin;Lee;Wen-Jay;Chen;Nan-Yow;Ma;William, Cheng-Yu;Su;Chun-Jung;Lee;Yao-Jen
國立成功大學	2018-10	Significance of Multivalley and Nonparabolic Band Structure for GeSn TFET Simulation	Kumar;Kunal;Hsieh;Yu-Feng;Liao;Jen-Hong;Kao;Kuo-Hsing;Wang;Yeong-Her
國立成功大學	2018-03	An FET With a Source Tunneling Barrier Showing Suppressed Short-Channel Effects for Low-Power Applications	Hsieh;Yu-Feng;Chen;Si-Hua;Chen;Nan-Yow;Lee;Wen-Jay;Tsai;Jyun-Hwei;Chen;Chun-Nan;Chiang;Meng-Hsueh;Lu;Darsen, Darsen D.;Kao;Kuo-Hsing
國立成功大學	2017-09	Improving the Electrical Performance of a Quantum Well FET With a Shell Doping Profile by Heterojunction Optimization	Kumar;Vijay, Malkundi Puttaveerappa;Hu;Chia-Ying;Walke;Mahadev, Amey;Kao;Kuo-Hsing;Chao;Tien-Sheng
國立成功大學	2017-06	Undoped and Doped Junctionless FETs: Source/Drain Contacts and Immunity to Random Dopant Fluctuation	Chen;Liang-Yu;Hsieh;Yu-Feng;Kao;Kuo-Hsing

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