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Showing items 1-6 of 6 (1 Page(s) Totally)
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| 國立成功大學 |
2013-08-12 |
純錫與錫基銲料合金之通電破壞特性研究
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藍功安; Lan, Gong-An |
| 國立成功大學 |
2013-07-06 |
純錫與錫基銲料合金之通電破壞特性研究
|
藍功安; Lan, Gong-An |
| 國立成功大學 |
2013-02 |
Effect of Alloying Elements on the Electrification-Fusion Phenomenon in Sn-Based Eutectic Alloys
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Lan, Gong-An; Lui, Truan-Sheng; Chen, Li-Hui |
| 國立成功大學 |
2012-11 |
= Electric Current-Induced Liquation Features of Cast Pure Tin
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Lan, Gong-An; Lui, Truan-Sheng; Chen, Li-Hui |
| 國立成功大學 |
2011-01 |
Effect of Zinc Content on Microstructural Evolution and Electrification-Fusion-Induced Failure Mechanism of Sn-xZn Alloys
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Lan, Gong-An; Yang, Chung-Wei; Lui, Truan-Sheng; Chen, Li-Hui |
| 國立成功大學 |
2009-05-05 |
The Weibull statistical analysis for evaluating microstructural effects on electrification-fusion phenomenon of Sn-xZn alloys
|
Lan, Gong-An; Yang, Chung-Wei; Lui, Truan-Sheng; Chen, Li-Hui |
Showing items 1-6 of 6 (1 Page(s) Totally)
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