|
English
|
正體中文
|
简体中文
|
Total items :0
|
|
Visitors :
52307601
Online Users :
996
Project Commissioned by the Ministry of Education
Project Executed by National Taiwan University Library
|
|
|
|
Taiwan Academic Institutional Repository >
Browse by Author
|
"pai fan yun"
Showing items 36-43 of 43 (1 Page(s) Totally)
1
View [10|25|50] records per page
| 國立臺灣大學 |
2008 |
供應鏈廠商間權力與合作行為之研究
|
白凢芸; Pai, Fan-Yun |
| 大葉大學 |
2007-10 |
The Use of Fuzzy Measures in a Performance - Evaluation Model for ERP Implementation among Taiwanese Semiconductor Manufacturers
|
Yang, Ching-Chow;Lin, Wen-Tsann;Pai, Fan-Yun;Yeh, Tsu-Ming |
| 國立臺灣大學 |
2007 |
Multi-objectives exception management model for semiconductor back-end environment under turnkey service
|
Guo, Ruey-Shan; Chiang, David M.; Pai, Fan-yun |
| 國立臺灣大學 |
2007 |
Evaluating the business value of RFID: Evidence from five case studies
|
Tzeng, Shiou-Fen; Chen, Wun-Hwa; Pai, Fan-Yun |
| 臺大學術典藏 |
2007 |
Multi-objectives exception management model for semiconductor back-end environment under turnkey service
|
Guo, Ruey-Shan; Chiang, David M.; Pai, Fan-Yun; Guo, Ruey-Shan; Chiang, David M.; Pai, Fan-yun |
| 臺大學術典藏 |
2007 |
Evaluating the business value of RFID: Evidence from five case studies
|
Tzeng, Shiou-Fen; Chen, Wun-Hwa; Pai, Fan-Yun; Tzeng, Shiou-Fen; Chen, Wun-Hwa; Pai, Fan-Yun |
| 國立臺灣大學 |
2006-02 |
A WIP-based Exception Management Model for Integrated Circuit Back-end Production Processes
|
Guo, Ruey-Shan; Chiang, David M.; Pai, Fan-Yun |
| 臺大學術典藏 |
2006-02 |
A WIP-based Exception Management Model for Integrated Circuit Back-end Production Processes
|
Guo, Ruey-Shan; Chiang, David M.; Pai, Fan-Yun; Guo, Ruey-Shan; Chiang, David M.; Pai, Fan-Yun |
Showing items 36-43 of 43 (1 Page(s) Totally)
1
View [10|25|50] records per page
|
