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Showing items 1-8 of 8 (1 Page(s) Totally)
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| 臺大學術典藏 |
2022-08-09T03:50:24Z |
Origin of Band Modulation in GeTe-Rich Ge-Sb-Te Thin Film
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Wong D.P.; Aminzare M.; Chou T.-L.; Pang C.-S.; Liu Y.-R.; Shen T.-H.; Chang B.K.; Lien H.-T.; Chang S.-T.; Chien C.-H.; Chen Y.-Y.; Chu M.-W.; Yang Y.-W.; Hsieh W.-P.; Rogl G.; Rogl P.; Kakefuda Y.; Mori T.; Chou M.-Y.; Chen L.-C.; Chen K.-H.; Wong D.P.; Pang C.-S.; Liu Y.-R.; Lien H.-T.; Chu M.-W.; Chen L.-C.; LI-CHYONG CHEN |
| 臺大學術典藏 |
2021-07-26T10:03:52Z |
Origin of Band Modulation in GeTe-Rich Ge-Sb-Te Thin Film
|
Wong D.P;Aminzare M;Chou T.-L;Pang C.-S;Liu Y.-R;Shen T.-H;Chang B.K;Lien H.-T;Chang S.-T;Chien C.-H;Chen Y.-Y;Chu M.-W;Yang Y.-W;Hsieh W.-P;Rogl G;Rogl P;Kakefuda Y;Mori T;Chou M.-Y;Chen L.-C;Chen K.-H.; Wong D.P; MING-YI CHOU et al. |
| 臺大學術典藏 |
2018-09-10T14:54:16Z |
Photo-induced tunneling currents in MOS structures with various HfO 2/SiO2 stacking dielectrics
|
Pang, C.-S.;Hwu, J.-G.; Pang, C.-S.; Hwu, J.-G.; JENN-GWO HWU |
| 臺大學術典藏 |
2018-09-10T14:54:16Z |
Photo-induced tunneling currents in MOS structures with various HfO 2/SiO2 stacking dielectrics
|
Pang, C.-S.;Hwu, J.-G.; Pang, C.-S.; Hwu, J.-G.; JENN-GWO HWU |
| 臺大學術典藏 |
2018-09-10T14:54:16Z |
Improvement in the breakdown endurance of high-κ dielectric by utilizing stacking technology and adding sufficient interfacial layer
|
Pang, C.-S.;Hwu, J.-G.; Pang, C.-S.; Hwu, J.-G.; JENN-GWO HWU |
| 臺大學術典藏 |
2018-09-10T14:54:16Z |
Improvement in the breakdown endurance of high-κ dielectric by utilizing stacking technology and adding sufficient interfacial layer
|
Pang, C.-S.;Hwu, J.-G.; Pang, C.-S.; Hwu, J.-G.; JENN-GWO HWU |
| 臺大學術典藏 |
2018-09-10T09:44:20Z |
Effect of electrons trapping/de-trapping at Si-SiO2 interface on two-state current in MOS(p) structure with ultra-thin SiO2 by anodization
|
Hwu, J.-G.; JENN-GWO HWU; Chen, T.-Y.;Pang, C.-S.;Hwu, J.-G.; Chen, T.-Y.; Pang, C.-S. |
| 臺大學術典藏 |
2018-09-10T09:44:20Z |
Effect of electrons trapping/de-trapping at Si-SiO2 interface on two-state current in MOS(p) structure with ultra-thin SiO2 by anodization
|
Hwu, J.-G.; JENN-GWO HWU; Chen, T.-Y.;Pang, C.-S.;Hwu, J.-G.; Chen, T.-Y.; Pang, C.-S. |
Showing items 1-8 of 8 (1 Page(s) Totally)
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