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Showing items 21-29 of 29 (3 Page(s) Totally)
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| 義守大學 |
2008 |
Characteristics of spontaneous reaction occurred by metal contamination and silicon substrate for ultralarge-scale integration semiconductor process
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Po-Ying Chen |
| 義守大學 |
2007/12/20 |
Investigation of Electrostatic Charges Trapping during 12-Inch Deep Submicron VLSI Proces
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Po-Ying Chen ; Chen, S.L. ; Tsai, M.H. ; Jing, M.H. ; Lin, T.-C. |
| 義守大學 |
2007/12/20 |
Implement of an Improvement Particle Monitoring Methodology in an Industry Production Process
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Po-Ying Chen ; Chen, S.L. ; Tsai, M.H. ; Jing, M.H. ; Lin, T.-C. |
| 義守大學 |
2007/12/20 |
Investigation of Wafer Strength in 12 inch Bare Wafer for Prevent Wafer Breakage
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Po-Ying Chen ; Jing, M.H. ; Tin, T.C. |
| 義守大學 |
2007/07/11 |
The Defects of Silicon Reacted with Carbon Content Vapour in ULSI Nano-meter-Generation Technology
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Po-Ying Chen ; Shen-Li Chen ; Ming-Hsiung Tsai ; Jing, M.H. ; Lin, T.-C. ; Cheng-Chia Kuo |
| 義守大學 |
2007/07/11 |
The Defects of Silicon Reacted with Carbon Content Vapour in ULSI Nano-meter-Generation Technology
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Po-Ying Chen ; Shen-Li Chen ; Ming-Hsiung Tsai ; Jing, M.H. ; Lin, T.-C. ; Cheng-Chia Kuo |
| 義守大學 |
2007/07/11 |
The Failure Mode Investigation of Barrier Layer TaN Combined with Al Pad Architecture using in Cu Process
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Po-Ying Chen ; Shen-Li Chen ; Ming-Hsiung Tsai ; Jing, M.H. ; Lin, T.-C. |
| 義守大學 |
2006/12/06 |
The effect of stressing history in reliability characteristics
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Po-Ying Chen ; Heng-Yu Kung ; Yi-Shao Lai ; Wen-Kuan Yeh |
| 中原大學 |
2005-07-28 |
以BPEL為基礎的服務導向式心臟照護系統之設計與實作
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陳柏穎; po-ying chen |
Showing items 21-29 of 29 (3 Page(s) Totally)
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