臺灣學術機構典藏系統 (Taiwan Academic Institutional Repository, TAIR)

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臺灣學術機構典藏系統 (Taiwan Academic Institutional Repository, TAIR)

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	2019臺灣學術機構典藏研討會
	機構典藏系統RC7版本已發佈

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Institution	Date	Title	Author
臺大學術典藏	2018-09-10T06:04:18Z	Intelligent IC Fabrication Diagnosis System	RUEY-SHAN GUO;S. Chang,;J. Lee;C. Tsai;R. Gu; RUEY-SHAN GUO; S. Chang,; J. Lee; C. Tsai; R. Gu; RUEY-SHAN GUO
臺大學術典藏	2018-09-10T06:04:18Z	End-of-line Quality Control and Abnormal Trend Detection for IC Fabrication	RUEY-SHAN GUO;J. Lee;S. Chang;J. Fan; RUEY-SHAN GUO; J. Lee; S. Chang; J. Fan; RUEY-SHAN GUO
臺大學術典藏	2018-09-10T06:04:18Z	Fuzzy Logic-based Process Diagnosis Using Water Acceptance Test Data	RUEY-SHAN GUO;S. Chang;J. Lee;C. Tsai; RUEY-SHAN GUO; S. Chang; J. Lee; C. Tsai; RUEY-SHAN GUO
臺大學術典藏	2018-09-10T06:04:18Z	Abnormal Trend Detection of End-of-line Data Using EWMA Chart	RUEY-SHAN GUO;J. Lee;S. Chang;R. Guo;J. Fan; RUEY-SHAN GUO; J. Lee; S. Chang; R. Guo; J. Fan; RUEY-SHAN GUO
臺大學術典藏	2018-09-10T05:00:39Z	Collaborative Engineering Mechanism between IC Design House and Foundry	RUEY-SHAN GUO;S. Chang;Y. Su; RUEY-SHAN GUO; S. Chang; Y. Su; RUEY-SHAN GUO
臺大學術典藏	2018-09-10T05:00:39Z	Inter-firm Collaboration Mechanism in Process Development and Product Design between Foundry and Fabless Design House	RUEY-SHAN GUO;S. Chang;Y. Su; RUEY-SHAN GUO; S. Chang; Y. Su; RUEY-SHAN GUO
臺大學術典藏	2018-09-10T05:00:39Z	Manufacturing and Engineering Collaboration Mechanism between Foundry and Fabless	RUEY-SHAN GUO;S. Chang;Y. Su; RUEY-SHAN GUO; S. Chang; Y. Su; RUEY-SHAN GUO
南台科技大學	2009	GaN-based LEDs output power improved by textured GaN/sapphire interface using in-situ SiH4 treatment process during epitaxial growth	李明倫; C. M. Tsai; J. K. Sheu; W.C. Lai; M. L. Lee; J. Chang; S. Chang; T. K. Ko; C. F. Shen
義守大學	2008-12	On calculating the time-varying elastance curve of a radial artery using a miniature vibration method	S. Chang; J.-J. Wang; H.-M. Su; C.-P. Liu
國立高雄師範大學	2007	Optical anisotropy in [hkil]-oriented wurtzite semiconductor quantum wells	李孟恩; C. Chen;S. Chang;M. Hung;J. Chiang;I. Lo;Meng-En Lee

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