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臺灣學術機構典藏系統 (Taiwan Academic Institutional Repository, TAIR)
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显示项目 21-45 / 83 (共4页)
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机构 日期 题名 作者
國立交通大學 2014-12-08T15:43:42Z Highly reliable chemical-mechanical polishing process for organic low-k methylsilsesquioxane Liu, PT; Chang, TC; Huang, MC; Tsai, MS; Sze, SM
國立交通大學 2014-12-08T15:43:18Z Electron energy level calculations for cylindrical narrow gap semiconductor quantum dot Li, YM; Liu, JL; Voskoboynikov, O; Lee, CP; Sze, SM
國立交通大學 2014-12-08T15:43:16Z Enhancing the resistance of low-k hydrogen silsesquioxane (HSQ) to wet stripper damage Chang, TC; Mor, YS; Liu, PT; Tsai, TM; Chen, CW; Mei, YJ; Sze, SM
國立交通大學 2014-12-08T15:43:16Z The effect of ammonia plasma treatment on low-k methyl-hybrido-silsesquioxane against photoresist stripping damage Chang, TC; Mor, YS; Liu, PT; Tsai, TM; Chen, CW; Mei, YJ; Sze, SM
國立交通大學 2014-12-08T15:43:16Z Improvement of low dielectric constant methylsilsesquioxane by boron implantation treatment Chang, TC; Mor, YS; Liu, PT; Tsai, TM; Chen, CW; Sze, SM; Mei, YJ
國立交通大學 2014-12-08T15:43:13Z Computer simulation of electron energy levels for different shape InAs/GaAs semiconductor quantum dots Li, YM; Voskoboynikov, O; Lee, CP; Sze, SM
國立交通大學 2014-12-08T15:43:11Z Effectiveness of NH3 plasma treatment in preventing wet stripper damage to low-k hydrogen silsesquioxane (HSQ) Chang, TC; Mor, YS; Liu, PT; Tsai, TM; Chen, CW; Mei, YJ; Sze, SM
國立交通大學 2014-12-08T15:43:08Z Electron energy state dependence on the shape and size of semiconductor quantum dots Li, YM; Voskoboynikov, O; Lee, CP; Sze, SM; Tretyak, O
國立交通大學 2014-12-08T15:43:08Z A new parallel adaptive finite volume method for the numerical simulation of semiconductor devices Li, YM; Liu, JL; Chao, TS; Sze, SM
國立交通大學 2014-12-08T15:42:58Z A practical implementation of parallel dynamic load balancing for adaptive computing in VLSI device simulation Li, Y; Sze, SM; Chao, TS
國立交通大學 2014-12-08T15:42:48Z Ambipolar Schottky-barrier TFTs Lin, HC; Yeh, KL; Huang, TY; Huang, RG; Sze, SM
國立交通大學 2014-12-08T15:42:46Z Effective strategy for porous organosilicate to suppress oxygen ashing damage Liu, PT; Chang, TC; Mor, YS; Chen, CW; Tsai, TM; Chu, CJ; Pan, FM; Sze, SM
國立交通大學 2014-12-08T15:42:33Z Effect of shape and size on electron transition energies of InAs semiconductor quantum dots Li, YM; Voskoboynikov, O; Lee, CP; Sze, SM; Tretyak, O
國立交通大學 2014-12-08T15:42:32Z Preventing dielectric damage of low-k organic siloxane by passivation treatment Chang, TC; Mor, YS; Liu, PT; Tsai, TM; Chen, CW; Mei, YJ; Pan, FM; Wu, WF; Sze, SM
國立交通大學 2014-12-08T15:42:29Z A computational method for energy level spin splitting simulation in InAs/GaAs semiconductor quantum dots Li, YM; Voskoboynikov, O; Lee, CP; Sze, SM; Tretyak, O
國立交通大學 2014-12-08T15:42:20Z Application of field-induced source/drain Schottky metal-oxide-semiconductor to fin-like body field-effect transistor Lin, HC; Wang, MF; Hou, FJ; Liu, JT; Huang, TY; Sze, SM
國立交通大學 2014-12-08T15:42:15Z Eliminating dielectric degradation of low-k organosilicate glass by trimethylchlorosilane treatment Chang, TC; Liu, PT; Mor, YS; Tsai, TM; Chen, CW; Mei, YJ; Pan, FM; Wu, WF; Sze, SM
國立交通大學 2014-12-08T15:42:14Z Effective repair to ultra-low-k dielectric material (k-2.0) by hexamethyidisilazane treatment Mor, YS; Chang, TC; Liu, PT; Tsai, TM; Chen, CW; Yan, ST; Chu, CJ; Wu, WF; Pan, FM; Lur, W; Sze, SM
國立交通大學 2014-12-08T15:42:13Z Characterization of porous silicate for ultra-low k dielectric application Liu, PT; Chang, TC; Hsu, KC; Tseng, TY; Chen, LM; Wang, CJ; Sze, SM
國立交通大學 2014-12-08T15:42:10Z A domain partition approach to parallel adaptive simulation of dynamic threshold voltage MOSFET Li, YM; Chao, TS; Sze, SM
國立交通大學 2014-12-08T15:42:08Z Recovering dielectric loss of low dielectric constant organic siloxane during the photoresist removal process Chang, TC; Mor, YS; Liu, PT; Tsai, TM; Chen, CW; Mei, YJ; Sze, SM
國立交通大學 2014-12-08T15:42:08Z Calculation of induced electron states in three-dimensional semiconductor artificial molecules Li, YM; Voskoboynikov, O; Lee, CP; Sze, SM
國立交通大學 2014-12-08T15:42:08Z Numerical simulation of quantum effects in high-k gate dielectric MOS structures using quantum mechanical models Li, YM; Lee, JW; Tang, TW; Chao, TS; Lei, TF; Sze, SM
國立交通大學 2014-12-08T15:42:07Z Electron energy state spin-splitting in 3D cylindrical semiconductor quantum dots Li, Y; Voskoboynikov; Lee, CP; Sze, SM; Tretyak, O
國立交通大學 2014-12-08T15:41:53Z Trimethylchlorosilane treatment of ultralow dielectric constant material after photoresist removal processing Chang, TC; Mor, YS; Liu, PT; Tsai, TM; Chen, CW; Chu, CJ; Pan, FM; Lur, W; Sze, SM

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