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臺灣學術機構典藏系統 (Taiwan Academic Institutional Repository, TAIR)
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Showing items 431-440 of 510  (51 Page(s) Totally)
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Institution Date Title Author
臺大學術典藏 2017 Distillation: A light-weight data separation design to boost performance of NVDIMM main memory. Chang, Yuan-Hao; Tsao, Che-Wei; Kuo, Tei-Wei; Tseng, Shau-Yin; TEI-WEI KUO
臺大學術典藏 2016 Pattern-aware write-back strategy to minimize energy consumption of PCM-based storage systems Chang, H.-S.;Chang, Y.-H.;Kuan, Y.-H.;Huang, X.-Z.;Kuo, T.-W.;Li, H.-P.; Chang, H.-S.; Chang, Y.-H.; Kuan, Y.-H.; Huang, X.-Z.; Kuo, T.-W.; Li, H.-P.; TEI-WEI KUO
臺大學術典藏 2016 Designing CPS/IoT applications for smart buildings and cities. Shih, Chi-Sheng;Chou, Jyun-Jhe;Reijers, Niels;Kuo, Tei-Wei; Shih, Chi-Sheng; Chou, Jyun-Jhe; Reijers, Niels; Kuo, Tei-Wei; TEI-WEI KUO
臺大學術典藏 2016 A disturbance-aware sub-block design to improve reliability of 3D MLC flash memory. Chang, Hung-Sheng;Chang, Yuan-Hao;Kuo, Tei-Wei;Chang, Yu-Ming;Li, Hsiang-Pang; TEI-WEI KUO; Li, Hsiang-Pang; Chang, Yu-Ming; Kuo, Tei-Wei; Chang, Yuan-Hao; Chang, Hung-Sheng
元智大學 2015-10-09 Rethinking I/O Request Management over eMMC-based Solid-State Drives Che-Wei Tsao; Chun-Yi Liu; Chien-Chung Ho; Tse-Yuan Wang; Yuan-Hao Chang; Tei-Wei Kuo
元智大學 2015-04-13 Reliability-Aware Striping with Minimized Performance Overheads for Flash-based Storage Devices Ming-Chang Yang; Yu-Ming Chang; Yuan-Hao Chang; Lue-Jane Lee; Tei-Wei Kuo
元智大學 2015-04-13 Reliability-Aware Striping with Minimized Performance Overheads for Flash-based Storage Devices Ming-Chang Yang; Yu-Ming Chang; Yuan-Hao Chang; Lue-Jane Lee; Tei-Wei Kuo
元智大學 2015-04-13 Reliability-Aware Striping with Minimized Performance Overheads for Flash-based Storage Devices Ming-Chang Yang; Yu-Ming Chang; Yuan-Hao Chang; Lue-Jane Lee; Tei-Wei Kuo
元智大學 2015-04-13 Reliability-Aware Striping with Minimized Performance Overheads for Flash-based Storage Devices Ming-Chang Yang; Yu-Ming Chang; Yuan-Hao Chang; Lue-Jane Lee; Tei-Wei Kuo
臺大學術典藏 2015 PWL: A progressive wear leveling to minimize data migration overheads for NAND flash devices Chen, F.-H.; Yang, M.-C.; Chang, Y.-H.; Kuo, T.-W.; TEI-WEI KUO; Chen, F.-H.;Yang, M.-C.;Chang, Y.-H.;Kuo, T.-W.

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