臺灣學術機構典藏系統 (Taiwan Academic Institutional Repository, TAIR)

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臺灣學術機構典藏系統 (Taiwan Academic Institutional Repository, TAIR)

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机构	日期	题名	作者
臺大學術典藏	2020-10-07T01:23:18Z	Impact of Quantum Confinement on Backgate-Bias Modulated Threshold-Voltage and Subthreshold Characteristics for Ultra-Thin-Body GeOI MOSFETs	C.-H. Yu; Y.-S. Wu; V. P.-H. Hu; P. Su; VITA PI-HO HU; C.-H. Yu; Y.-S. Wu; V. P.-H. Hu; P. Su; 胡璧合; VITA PI-HO HU
臺大學術典藏	2020-10-07T01:23:18Z	Impact of Quantum Confinement on Backgate-Bias Modulated Threshold-Voltage and Subthreshold Characteristics for Ultra-Thin-Body GeOI MOSFETs	C.-H. Yu; Y.-S. Wu; V. P.-H. Hu; P. Su; VITA PI-HO HU; C.-H. Yu; Y.-S. Wu; V. P.-H. Hu; P. Su; 胡璧合; VITA PI-HO HU
臺大學術典藏	2020-10-07T01:23:18Z	Band-to-Band-Tunneling Leakage Suppression for Ultra-Thin-Body GeOI MOSFETs Using Transistor Stacking	VITA PI-HO HU; 胡璧合; C.-T. Chuang; P. Su; M.-L. Fan; V. P.-H. Hu; VITA PI-HO HU; V. P.-H. Hu; M.-L. Fan; P. Su; C.-T. Chuang
臺大學術典藏	2020-10-07T01:23:18Z	Band-to-Band-Tunneling Leakage Suppression for Ultra-Thin-Body GeOI MOSFETs Using Transistor Stacking	VITA PI-HO HU; 胡璧合; C.-T. Chuang; P. Su; M.-L. Fan; V. P.-H. Hu; VITA PI-HO HU; V. P.-H. Hu; M.-L. Fan; P. Su; C.-T. Chuang
臺大學術典藏	2020-10-07T01:23:18Z	Impact of Quantum Confinement on Subthreshold Swing and Electrostatic Integrity of Ultra-Thin-Body GeOI and InGaAs-OI n-MOSFETs	Y.-S. Wu; C.-H. Yu; V. P.-H. Hu; P. Su; VITA PI-HO HU; C.-H. Yu; Y.-S. Wu; V. P.-H. Hu; P. Su; 胡璧合; VITA PI-HO HU
臺大學術典藏	2020-10-07T01:23:18Z	Impact of Quantum Confinement on Subthreshold Swing and Electrostatic Integrity of Ultra-Thin-Body GeOI and InGaAs-OI n-MOSFETs	Y.-S. Wu; C.-H. Yu; V. P.-H. Hu; P. Su; VITA PI-HO HU; C.-H. Yu; Y.-S. Wu; V. P.-H. Hu; P. Su; 胡璧合; VITA PI-HO HU
臺大學術典藏	2020-10-07T01:23:17Z	Analysis of Single-Trap-Induced Random Telegraph Noise on FinFET Devices, 6T SRAM Cell, and Logic Circuits	VITA PI-HO HU; 胡璧合; C.-T. Chuang; P. Su; Y.-N. Chen; V. P.-H. Hu; M.-L. Fan; VITA PI-HO HU; C.-T. Chuang; Y.-N. Chen; P. Su; V. P.-H. Hu; M.-L. Fan
臺大學術典藏	2020-10-07T01:23:17Z	Analysis of Single-Trap-Induced Random Telegraph Noise on FinFET Devices, 6T SRAM Cell, and Logic Circuits	VITA PI-HO HU; 胡璧合; C.-T. Chuang; P. Su; Y.-N. Chen; V. P.-H. Hu; M.-L. Fan; VITA PI-HO HU; C.-T. Chuang; Y.-N. Chen; P. Su; V. P.-H. Hu; M.-L. Fan
臺大學術典藏	2020-10-07T01:23:17Z	Variability Analysis of Sense Amplifier for FinFET Subthreshold SRAM Applications	胡璧合; VITA PI-HO HU; C.-T. Chuang; P. Su; Y.-N. Chen; V. P.-H. Hu; M.-L. Fan; VITA PI-HO HU; P. Su; C.-T. Chuang; Y.-N. Chen; V. P.-H. Hu; M.-L. Fan
臺大學術典藏	2020-10-07T01:23:17Z	Variability Analysis of Sense Amplifier for FinFET Subthreshold SRAM Applications	胡璧合; VITA PI-HO HU; C.-T. Chuang; P. Su; Y.-N. Chen; V. P.-H. Hu; M.-L. Fan; VITA PI-HO HU; P. Su; C.-T. Chuang; Y.-N. Chen; V. P.-H. Hu; M.-L. Fan

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