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| 國立交通大學 |
2017-04-21T06:49:39Z |
3D 65nm CMOS with 320 degrees C Microwave Dopant Activation
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Lee, Yao-Jen; Lu, Yu-Lun; Hsueh, Fu-Kuo; Huang, Kuo-Chin; Wan, Chia-Chen; Cheng, Tz-Yen; Han, Ming-Hung; Kowalski, Jeff M.; Kowalski, Jeff E.; Heh, Dawei; Chuang, Hsi-Ta; Li, Yiming; Chao, Tien-Sheng; Wu, Ching-Yi; Yang, Fu-Liang |
| 國立交通大學 |
2017-04-21T06:49:10Z |
Impacts of a buffer layer and hi-wafers on the performance of strained-channel NMOSFETs with SiN capping layer
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Tsai, Tzu-, I; Lee, Yao-Jen; Chen, King-Sheng; Wang, Jeff; Wan, Chia-Chen; Hsueh, Fu-Kuo; Lin, Horng-Chih; Chao, Tien-Sheng; Huang, Tiao-Yuan |
| 國立交通大學 |
2017-04-21T06:49:10Z |
Reliability of strained-channel NMOSFETs with SiN capping layer on Hi-wafers with a thin LPCVD-TEOS buffer layer
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Tsai, Tzu-, I; Lee, Yao-Jen; Chen, King-Sheng; Wang, Jeff; Wan, Chia-Chen; Hsueh, Fu-Kuo; Lin, Horng-Chih; Cha, Tien-Sheng; Huang, Tiao-Yuan |
| 國立交通大學 |
2017-04-21T06:48:46Z |
Suspended Ge Gate-All-Around Nanowire nFETs with Junction Isolation on Bulk Si
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Wan, Chia-Chen; Luo, Guang-Li; Hsu, Shu-Han; Hung, Kuo-Dong; Chu, Chun-Lin; Hou, Tuo-Hung; Su, Chun-Jun; Chen, Szu-Hung; Wu, Wen-Fa; Yeh, Wen-Kuan |
| 國立交通大學 |
2015-07-21T08:31:06Z |
3D Vertical TaOx/TiO2 RRAM with over 10(3) Self-Rectifying Ratio and Sub-mu A Operating Current
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Hsu, Chung-Wei; Wan, Chia-Chen; Wang, I-Ting; Chen, Mei-Chin; Lo, Chun-Li; Lee, Yao-Jen; Jang, Wen-Yueh; Lin, Chen-Hsi; Hou, Tuo-Hung |
| 國立交通大學 |
2014-12-12T03:06:26Z |
應用新穎低溫微波退火製程製作奈米級薄膜電晶體之分析研究
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萬嘉塵; Wan, Chia-Chen; 趙天生; 李耀仁; Chao, Tien Sheng; Lee, Yao-Jen |
| 國立交通大學 |
2014-12-08T15:35:50Z |
Homogeneous barrier modulation of TaOx/TiO2 bilayers for ultra-high endurance three-dimensional storage-class memory
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Hsu, Chung-Wei; Wang, Yu-Fen; Wan, Chia-Chen; Wang, I-Ting; Chou, Chun-Tse; Lai, Wei-Li; Lee, Yao-Jen; Hou, Tuo-Hung |
Showing items 1-7 of 7 (1 Page(s) Totally)
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