|
|
???tair.name??? >
???browser.page.title.author???
|
"wu kuo ming"???jsp.browse.items-by-author.description???
Showing items 1-10 of 55 (6 Page(s) Totally)
1 2 3 4 5 6 > >>
View [10|25|50] records per page
| 國立彰化師範大學 |
2011 |
Influence of Asymmetric Disks on Control Over the Existence of Vortex in Submicrometer-scaled Permalloy Disks
|
Huang, Chao-Hsien; Wu, Kuo-Ming; Wang, Chih-Yi; Wu, Jong-Ching; Horng, Lance |
| 國立彰化師範大學 |
2011 |
Influence of Asymmetric Disks on Control over the Existence of Vortex in Submicrometer-scaled Permalloy Disks
|
Huang, Chao-Hsien; Wu, Kuo-Ming; Wang, Chih-Yi; Wu, Jong-Ching; Horng, Lance |
| 國立彰化師範大學 |
2010-06 |
Study of One-Side-Flat Edge on Vortex in Submicro-Scaled Permalloy Disks
|
Huang, Chao-Hsien; Yang, Cheng-Ta; Wu, Kuo-Ming; Wu, Tian-Chiuan; Wu, Jong-Ching; Horng, Lance |
| 國立彰化師範大學 |
2010-06 |
Study of One-Side-Flat Edge on Vortex in Submicro-Scaled Permalloy Disks
|
Huang, Chao-Hsien; Yang, Cheng-Ta; Wu, Kuo-Ming; Wu, Tian-Chiuan; Wu, Jong-Ching; Horng, Lance |
| 國立成功大學 |
2009-12 |
Mechanisms of Hot-Carrier-Induced Threshold-Voltage Shift in High-Voltage p-Type LDMOS Transistors
|
Chen, Jone F.; Tian, Kuen-Shiuan; Chen, Shiang-Yu; Wu, Kuo-Ming; Shih, J. R.; Wu, Kenneth |
| 國立成功大學 |
2009-11 |
Convergence of Hot-Carrier-Induced Saturation Region Drain Current and On-Resistance Degradation in Drain Extended MOS Transistors
|
Chen, Jone F.; Chen, Shiang-Yu; Wu, Kuo-Ming; Shih, J. R.; Wu, Kenneth |
| 國立成功大學 |
2009-09 |
An Investigation on Anomalous Hot-Carrier-Induced On-Resistance Reduction in n-Type LDMOS Transistors
|
Chen, Jone F.; Tian, Kuen-Shiuan; Chen, Shiang-Yu; Wu, Kuo-Ming; Shih, J. R.; Wu, Kenneth |
| 國立成功大學 |
2009-04 |
Investigation of Hot-Carrier-Induced Degradation Mechanisms in p-Type High-Voltage Drain Extended Metal-Oxide-Semiconductor Transistors
|
Chen, Jone F.; Chen, Shiang-Yu; Wu, Kuo-Ming; Liu, C. M. |
| 國立成功大學 |
2009-04 |
Mechanism and Modeling of On-Resistance Degradation in n-Type Lateral Diffused Metal-Oxide-Semiconductor Transistors
|
Chen, Jone F.; Tian, Kuen-Shiuan; Chen, Shiang-Yu; Wu, Kuo-Ming; Liu, C. M. |
| 國立成功大學 |
2008-12-01 |
Channel length dependence of hot-carrier-induced degradation in n-type drain extended metal-oxide-semiconductor transistors
|
Chen, Jone F.; Chen, Shiang-Yu; Wu, Kuo-Ming; Liu, C. M. |
Showing items 1-10 of 55 (6 Page(s) Totally)
1 2 3 4 5 6 > >>
View [10|25|50] records per page
|
