臺灣學術機構典藏系統 (Taiwan Academic Institutional Repository, TAIR)

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臺灣學術機構典藏系統 (Taiwan Academic Institutional Repository, TAIR)

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	Repositories
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	2019臺灣學術機構典藏研討會
	機構典藏系統RC7版本已發佈

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	機構典藏計畫網站
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	臺大學術典藏NTU Scholars

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Institution	Date	Title	Author
國立中山大學	2004	Leptin and connective tissue growth factor in advanced glycation end-product-induced effects in NRK-49F cells	C.I. Lee;J.Y. Guh;H.C. Chen;K.H. Lin;Y.L. Yang; W.C. Hung;Y.H. Lai;Y.J. Chuang
國立中山大學	2002	Silicide Formation of Au Thin Films on (100) Si During Annealing	J.F. Chang; T.F. Young; Y.L. Yang; H.Y. Ueng; T.C. Chang
國立中山大學	2000	Study on the Si-Si Surface Vibrational States of Porous Si	T.F. Young; J.P. Chen;J.F. Liou;Y.L. Yang; T.C. Chang; C.Y. Chang
中原大學	1999	Expert System for Enhancing Voltage Security/Stability in Power Systems	Y.Y. Hong;Y.L. Yang
國立中山大學	1998	Raman and Fourier Transform Infrared Spectroscopy Study on the Si-Si Vibrational States Near Surface Regions of Porous Silicon	T.F. Young;J.F. Liou;J.P. Chen;Y.L. Yang;T.C. Chang
國立中山大學	1998	Study on the Si-Si Surface Vibrational States of Porous Si	T.F. Young;J.P. Chen;J.F. Liou;Y.L. Yang;T.C. Chang;C.Y. Chang
國立中山大學	1997	Study on the Si-Si Surface Vibrational States of Porous Si	T.F. Young;J.F. Liou;Y.L. Yang;T.C. Chang;C.Y. Chang
國立中山大學	1997	DC Conductivity of Metallic Thin Film with Fractal Structure	T.F. Young;H.J. Fang;J.F. Liou;Y.L. Yang;T.C. Chang;C.Y. Chang
國立中山大學	1996	Atomic Force Microscopic Study On the Surface Structure of Oxidized Porous Silicion	T.F. Young; I.W. Hunag; Y.L. Yang; W.C. Kuo; I.M. Jiang; T.C. Chang; C.Y. Chang
國立中山大學	1996	Atomic Force Microscope Study on the Surface Structure of Oxidized Porous Silicon	T.F. Young;I.W. Huang;Y.L. Yang;W.C. Kuo;I.M. Jiang;T.C. Chang;C.Y. Chang
國立中山大學	1996	Atomic Force Microscope Study on the Surface Structure of Oxidized Porous Silicon	T.F. Young;I.W. Huang;Y.L. Yang;W.C. Kuo;I.M. Jiang;T.C. Chang;C.Y. Chang
國立中山大學	1996	Study on conductivity of Ag thin film depositd on oxidized porpus silibon	T.F. Young;Y.L. Yang;I.W. Huang
國立中山大學	1995	Atomic Force Microscopy Study on the Surface Structure of Oxidized Porous Silicon	T.F. Young;I.W. Huang;Y.L. Yang;W.C. Kuo;I.M. Jiang;T.C. Chang;C.Y. Chang

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