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臺灣學術機構典藏系統 (Taiwan Academic Institutional Repository, TAIR)
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Showing items 11-20 of 87  (9 Page(s) Totally)
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Institution Date Title Author
國立中山大學 2009 Nonuniform and negative marker displacements induced by current crowding during electromigration in flip-chip Sn-0.7 Cu solder joints S.W. Liang;H.Y. Hsiao;C. Chen;L. Xu;K.N. Tu;Y.S. Lai
國立中山大學 2009 First-principles calculations of elastic properties of Cu3Sn and Cu6Sn5 intermetallics J. Chen;Y.S. Lai;P.F. Yang
國立中山大學 2009 In situ measurements of thermal and electrical effects of strain in flip-chip silicon dies using synchrotron radiation x-rays A.T. Wu;C.Y. Tsai;C.L. Kao;M.K. Shih;Y.S. Lai;H.Y. Lee;C.S. Ku
國立中山大學 2009 Fundamental study of the intermixing of 95Pb-5Sn high-lead solder bumps and 37Pb-63Sn pre-solder on chip-carrier substrates C.C. Chang;Y.W. Lin;Y.S. Lai;C.R. Kao
國立中山大學 2009 Thermomigration versus electromigration in microelectronics solder joints M.F. Abdulhamid;C. Basaran;Y.S. Lai
國立中山大學 2009 Design optimization of needle geometry for wafer-level probing test M.K. Shih;Y.S. Lai
國立中山大學 2009 In situ measurement of electromigration-induced transient stress in Pb-free Sn-Cu solder joints by synchrotron radiation based x-ray polychromatic microdiffraction K. Chen;N. Tamura;M. Kunz;K.N. Tu;Y.S. Lai
國立中山大學 2009 Electromigration on void formation of Sn3Ag1.5Cu FCBGA solder joints M.H. R. Jen;L.C. Liu;Y.S. Lai
國立中山大學 2009 Structural and elastic properties of Cu6Sn5 and Cu3Sn from first-principles calculations J. Chen;Y.S. Lai;P.F. Yang;C.Y. Ren;D.J. Huang
國立中山大學 2009 Effect of multiple reflow cycles on ball impact responses of Sn-Ag-Cu solder joints Y.S. Lai;C.R. Kao;H.C. Chang;C.L. Kao

Showing items 11-20 of 87  (9 Page(s) Totally)
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