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臺灣學術機構典藏系統 (Taiwan Academic Institutional Repository, TAIR)
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Showing items 1-14 of 14  (1 Page(s) Totally)
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Institution Date Title Author
國立成功大學 2015-05-04 Impact of repeated uniaxial mechanical strain on p-type flexible polycrystalline thin film transistors Chen, Bo-Wei; Chang, Ting-Chang; Hung, Yu-Ju; Hsieh, Tien-Yu; Tsai, Ming-Yen; Liao, Po-Yung; Chen, Bo-Yao; Tu, Yi-Hsien; Lin, Yuan-Yao; Tsai, Wu-Wei; Yan, Jing-Yi
國立交通大學 2014-12-08T15:33:46Z Investigation of gate-bias stress and hot-carrier stress-induced instability of InGaZnO thin-film transistors under different environments Hsieh, Tien-Yu; Chang, Ting-Chang; Chen, Te-Chih; Tsai, Ming-Yen; Chen, Yu-Te; Jian, Fu-Yen; Lin, Chia-Sheng; Tsai, Wu-Wei; Chiang, Wen-Jen; Yan, Jing-Yi
國立交通大學 2014-12-08T15:33:32Z Reduction of defect formation in amorphous indium-gallium-zinc-oxide thin film transistors by N2O plasma treatment Jhu, Jhe-Ciou; Chang, Ting-Chang; Chang, Geng-Wei; Tai, Ya-Hsiang; Tsai, Wu-Wei; Chiang, Wen-Jen; Yan, Jing-Yi
國立交通大學 2014-12-08T15:31:45Z Dependence of Light-Accelerated Instability on Bias and Environment in Amorphous Indium-Gallium-Zinc-Oxide Thin Film Transistors Chen, Yu-Chun; Chang, Ting-Chang; Li, Hung-Wei; Chung, Wan-Fang; Hsieh, Tien-Yu; Chen, Yi-Hsien; Tsai, Wu-Wei; Chiang, Wen-Jen; Yan, Jing-Yi
國立交通大學 2014-12-08T15:12:15Z Solid-state structure of the naphthalene-based n-type semiconductor, and performance improved with Mo-based source/drain electrodes Kao, Chia-Chun; Lin, Pang; Shen, Yu-Yuan; Yan, Jing-Yi; Ho, Jia-Chong; Lee, Cheng-Chung; Chan, Li-Hsin
國立交通大學 2014-12-08T15:10:19Z Perylenetetracarboxylic di-imide-based bottom-contact devices: A study on two kinds of source/drain electrodes, ITO and MoW Kao, Chia-Chun; Lin, Pang; Shen, Yu-Yuan; Yan, Jing-Yi; Ho, Jia-Chong; Lee, Cheng-Chung; Chan, Li-Hsin
國立交通大學 2014-12-08T15:09:40Z Performance of Organic Thin-Film Transistors Controlled by Electrode and Device Structures Yu, Chien-Hsien; Lei, Tan-Fu; Liao, Jin-Long; Yan, Jing-Yi; Ho, Jia-Chong
國立成功大學 2014-12-01 Investigation of temperature-dependent asymmetric degradation behavior induced by hot carrier effect in oxygen ambiance in In-Ga-Zn-O thin film transistors Chen, Bo-Wei; Chang, Ting-Chang; Hung, Yu-Ju; Hsieh, Tien-Yu; Tsai, Ming-Yen; Liao, Po-Yung; Tsai, Wu-Wei; Chiang, Wen-Jen; Yan, Jing-Yi
國立成功大學 2013-09-30 Asymmetric structure-induced hot-electron injection under hot-carrier stress in a-InGaZnO thin film transistor Tsai, Ming-Yen; Chang, Ting-Chang; Chu, Ann-Kuo; Chen, Te-Chih; Hsieh, Tien-Yu; Lin, Kun-Yao; Tsai, Wu-Wei; Chiang, Wen-Jen; Yan, Jing-Yi
國立成功大學 2013-09 Investigation of gate-bias stress and hot-carrier stress-induced instability of InGaZnO thin-film transistors under different environments Hsieh, Tien-Yu; Chang, Ting-Chang; Chen, Te-Chih; Tsai, Ming-Yen; Chen, Yu-Te; Jian, Fu-Yen; Lin, Chia-Sheng; Tsai, Wu-Wei; Chiang, Wen-Jen; Yan, Jing-Yi
國立成功大學 2013-07-01 High temperature-induced abnormal suppression of sub-threshold swing and on-current degradations under hot-carrier stress in a-InGaZnO thin film transistors Tsai, Ming-Yen; Chang, Ting-Chang; Chu, Ann-Kuo; Hsieh, Tien-Yu; Chen, Te-Chih; Lin, Kun-Yao; Tsai, Wu-Wei; Chiang, Wen-Jen; Yan, Jing-Yi
國立成功大學 2013-01-15 Investigating the degradation behavior under hot carrier stress for InGaZnO TFTs with symmetric and asymmetric structures Tsai, Ming-Yen; Chang, Ting-Chang; Chu, Ann-Kuo; Chen, Te-Chih; Hsieh, Tien-Yu; Chen, Yu-Te; Tsai, Wu-Wei; Chiang, Wen-Jen; Yan, Jing-Yi
國立成功大學 2013 Dependence of Light-Accelerated Instability on Bias and Environment in Amorphous Indium-Gallium-Zinc-Oxide Thin Film Transistors Chen, Yu-Chun; Chang, Ting-Chang; Li, Hung-Wei; Chung, Wan-Fang; Hsieh, Tien-Yu; Chen, Yi-Hsien; Tsai, Wu-Wei; Chiang, Wen-Jen; Yan, Jing-Yi
國立成功大學 2012-11-19 Application of in-cell touch sensor using photo-leakage current in dual gate a-InGaZnO thin-film transistors Hsieh, Tien-Yu; Chang, Ting-Chang; Chen, Te-Chih; Chen, Yu-Chun; Chen, Yu-Te; Liao, Po-Yung; Chu, Ann-Kuo; Tsai, Wu-Wei; Chiang, Wen-Jen; Yan, Jing-Yi

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