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"yan jing yi"的相關文件
顯示項目 1-14 / 14 (共1頁)
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| 國立成功大學 |
2015-05-04 |
Impact of repeated uniaxial mechanical strain on p-type flexible polycrystalline thin film transistors
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Chen, Bo-Wei; Chang, Ting-Chang; Hung, Yu-Ju; Hsieh, Tien-Yu; Tsai, Ming-Yen; Liao, Po-Yung; Chen, Bo-Yao; Tu, Yi-Hsien; Lin, Yuan-Yao; Tsai, Wu-Wei; Yan, Jing-Yi |
| 國立交通大學 |
2014-12-08T15:33:46Z |
Investigation of gate-bias stress and hot-carrier stress-induced instability of InGaZnO thin-film transistors under different environments
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Hsieh, Tien-Yu; Chang, Ting-Chang; Chen, Te-Chih; Tsai, Ming-Yen; Chen, Yu-Te; Jian, Fu-Yen; Lin, Chia-Sheng; Tsai, Wu-Wei; Chiang, Wen-Jen; Yan, Jing-Yi |
| 國立交通大學 |
2014-12-08T15:33:32Z |
Reduction of defect formation in amorphous indium-gallium-zinc-oxide thin film transistors by N2O plasma treatment
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Jhu, Jhe-Ciou; Chang, Ting-Chang; Chang, Geng-Wei; Tai, Ya-Hsiang; Tsai, Wu-Wei; Chiang, Wen-Jen; Yan, Jing-Yi |
| 國立交通大學 |
2014-12-08T15:31:45Z |
Dependence of Light-Accelerated Instability on Bias and Environment in Amorphous Indium-Gallium-Zinc-Oxide Thin Film Transistors
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Chen, Yu-Chun; Chang, Ting-Chang; Li, Hung-Wei; Chung, Wan-Fang; Hsieh, Tien-Yu; Chen, Yi-Hsien; Tsai, Wu-Wei; Chiang, Wen-Jen; Yan, Jing-Yi |
| 國立交通大學 |
2014-12-08T15:12:15Z |
Solid-state structure of the naphthalene-based n-type semiconductor, and performance improved with Mo-based source/drain electrodes
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Kao, Chia-Chun; Lin, Pang; Shen, Yu-Yuan; Yan, Jing-Yi; Ho, Jia-Chong; Lee, Cheng-Chung; Chan, Li-Hsin |
| 國立交通大學 |
2014-12-08T15:10:19Z |
Perylenetetracarboxylic di-imide-based bottom-contact devices: A study on two kinds of source/drain electrodes, ITO and MoW
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Kao, Chia-Chun; Lin, Pang; Shen, Yu-Yuan; Yan, Jing-Yi; Ho, Jia-Chong; Lee, Cheng-Chung; Chan, Li-Hsin |
| 國立交通大學 |
2014-12-08T15:09:40Z |
Performance of Organic Thin-Film Transistors Controlled by Electrode and Device Structures
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Yu, Chien-Hsien; Lei, Tan-Fu; Liao, Jin-Long; Yan, Jing-Yi; Ho, Jia-Chong |
| 國立成功大學 |
2014-12-01 |
Investigation of temperature-dependent asymmetric degradation behavior induced by hot carrier effect in oxygen ambiance in In-Ga-Zn-O thin film transistors
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Chen, Bo-Wei; Chang, Ting-Chang; Hung, Yu-Ju; Hsieh, Tien-Yu; Tsai, Ming-Yen; Liao, Po-Yung; Tsai, Wu-Wei; Chiang, Wen-Jen; Yan, Jing-Yi |
| 國立成功大學 |
2013-09-30 |
Asymmetric structure-induced hot-electron injection under hot-carrier stress in a-InGaZnO thin film transistor
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Tsai, Ming-Yen; Chang, Ting-Chang; Chu, Ann-Kuo; Chen, Te-Chih; Hsieh, Tien-Yu; Lin, Kun-Yao; Tsai, Wu-Wei; Chiang, Wen-Jen; Yan, Jing-Yi |
| 國立成功大學 |
2013-09 |
Investigation of gate-bias stress and hot-carrier stress-induced instability of InGaZnO thin-film transistors under different environments
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Hsieh, Tien-Yu; Chang, Ting-Chang; Chen, Te-Chih; Tsai, Ming-Yen; Chen, Yu-Te; Jian, Fu-Yen; Lin, Chia-Sheng; Tsai, Wu-Wei; Chiang, Wen-Jen; Yan, Jing-Yi |
| 國立成功大學 |
2013-07-01 |
High temperature-induced abnormal suppression of sub-threshold swing and on-current degradations under hot-carrier stress in a-InGaZnO thin film transistors
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Tsai, Ming-Yen; Chang, Ting-Chang; Chu, Ann-Kuo; Hsieh, Tien-Yu; Chen, Te-Chih; Lin, Kun-Yao; Tsai, Wu-Wei; Chiang, Wen-Jen; Yan, Jing-Yi |
| 國立成功大學 |
2013-01-15 |
Investigating the degradation behavior under hot carrier stress for InGaZnO TFTs with symmetric and asymmetric structures
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Tsai, Ming-Yen; Chang, Ting-Chang; Chu, Ann-Kuo; Chen, Te-Chih; Hsieh, Tien-Yu; Chen, Yu-Te; Tsai, Wu-Wei; Chiang, Wen-Jen; Yan, Jing-Yi |
| 國立成功大學 |
2013 |
Dependence of Light-Accelerated Instability on Bias and Environment in Amorphous Indium-Gallium-Zinc-Oxide Thin Film Transistors
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Chen, Yu-Chun; Chang, Ting-Chang; Li, Hung-Wei; Chung, Wan-Fang; Hsieh, Tien-Yu; Chen, Yi-Hsien; Tsai, Wu-Wei; Chiang, Wen-Jen; Yan, Jing-Yi |
| 國立成功大學 |
2012-11-19 |
Application of in-cell touch sensor using photo-leakage current in dual gate a-InGaZnO thin-film transistors
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Hsieh, Tien-Yu; Chang, Ting-Chang; Chen, Te-Chih; Chen, Yu-Chun; Chen, Yu-Te; Liao, Po-Yung; Chu, Ann-Kuo; Tsai, Wu-Wei; Chiang, Wen-Jen; Yan, Jing-Yi |
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