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| 國立交通大學 |
2014-12-08T15:16:09Z |
Reproducing subthreshold characteristics of metal-oxide-semiconductor field effect transistors under shallow trench isolation mechanical stress using a stress-dependent diffusion model
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Sheu, Yi-Ming; Yang, Sheng-Jier; Wang, Chih-Chiang; Chang, Chih-Sheng; Chen, Ming-Jer; Liu, Sally; Diaz, Carlos H. |
| 國立交通大學 |
2014-12-08T15:15:28Z |
Modeling the well-edge proximity effect in highly scaled MOSFETs
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Sheu, Yi-Ming; Su, Ke-Wei; Tian, Shiyang; Yang, Sheng-Jier; Wang, Chih-Chiang; Chen, Ming-Jer; Liu, Sally |
| 國立成功大學 |
2009-08 |
New Observations in LOD Effect of 45-nm P-MOSFETs With Strained SiGe Source/Drain and Dummy Gate
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Cheng, Chung-Yun; Fang, Yean-Kuen; Hsieh, Jang-Cheng; Yang, Sheng-Jier; Sheu, Yi-Ming; Hsia, Harry |
Showing items 1-3 of 3 (1 Page(s) Totally)
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