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Showing items 238251-238260 of 2348971 (234898 Page(s) Totally) << < 23821 23822 23823 23824 23825 23826 23827 23828 23829 23830 > >> View [10|25|50] records per page
| 大葉大學 |
2008-08 |
Capability Renewal through Corporate Venturing
|
Huang, Yi-Fen |
| 國立交通大學 |
2014-12-08T15:34:57Z |
Capability testing based on CPM with multiple samples
|
Wu, CW; Pearn, WL |
| 國立臺灣科技大學 |
2005 |
Capability testing based on Cpm with multiple samples
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Wu, Chien-Wei; Pearn, W. L. |
| 中華大學 |
2010 |
Capability testing based on subsamples: a case on photolithography process control in wafer fabrication
|
李欣怡; Lee, Amy Hsin-I |
| 國立臺灣科技大學 |
2010 |
Capability testing based on subsamples: a case on photolithography process control in wafer fabrication
|
Liao, M. Y. ; Kang, H. Y. ; Lee, A. H. I. ; Wu, Chien-Wei |
| 國立勤益科技大學 |
2010 |
Capability Testing Based on Subsamples: A Case on Photolithography Process Control in Wafer Fabrication.
|
康鶴耀 |
| 臺大學術典藏 |
2018-09-10T08:45:08Z |
Capability-Aligned Matching: Improving Quality of Games with a Purpose
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YUNG-JEN HSU; Hsu, Jane Yung-jen; Chiou, Che-Liang;Hsu, Jane Yung-jen; Chiou, Che-Liang |
| 臺大學術典藏 |
2021-11-21T23:19:02Z |
Capacitance Analysis of Transient Behaviour Improved Metal-Insulator-Semiconductor Tunnel Diodes with Ultra Thin Metal Surrounded Gate
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Huang, Sung Wei; JENN-GWO HWU |
| 國立交通大學 |
2015-07-21T08:29:23Z |
Capacitance Characteristic Optimization of Germanium MOSFETs with Aluminum Oxide by Using a Semiconductor-Device-Simulation-Based Multi-Objective Evolutionary Algorithm Method
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Li, Yiming; Chen, Chieh-Yang |
| 國立交通大學 |
2014-12-08T15:12:00Z |
Capacitance Characteristics Improvement and Power Enhancement for RF LDMOS Transistors Using Annular Layout Structure
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Chiu, Chia-Sung; Chen, Kun-Ming; Huang, Guo-Wei; Chen, Ming-I.; Yang, Yu-Chi; Wang, Kai-Li |
Showing items 238251-238260 of 2348971 (234898 Page(s) Totally) << < 23821 23822 23823 23824 23825 23826 23827 23828 23829 23830 > >> View [10|25|50] records per page
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