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Institution	Date	Title	Author
臺大學術典藏	2021-12-21T23:17:06Z	Deep learning–assisted burn wound diagnosis: Diagnostic model development Study	Chang, Che Wei; Lai, Feipei; Christian, Mesakh; Chen, Yu Chun; Hsu, Ching; Chen, Yo Shen; Chang, Dun Hao; Roan, Tyng Luen; Yu, Yen Che
臺大學術典藏	2022-04-25T06:44:23Z	Deep learning–assisted burn wound diagnosis: Diagnostic model development Study	Chang C.W;Lai F;Christian M;Chen Y.C;Hsu C;Chen Y.S;Chang D.H;Roan T.L;Yu Y.C.; Chang C.W; Lai F; Christian M; Chen Y.C; Hsu C; Chen Y.S; Chang D.H; Roan T.L; Yu Y.C.; FEI-PEI LAI
臺大學術典藏	2009-02-04T18:50:58Z	Deep Level Analysis of MBE Grown InAlAs Strained Layers	Wu, C. W.; Lin, Hao-Hsiung; 林浩雄; Lee, T. L.; Liu, J. S.; Liu, J. S.; Lee, T. L.; Wu, C. W.; Lin, Hao-Hsiung
國立臺灣大學	1993	Deep Level Analysis of MBE Grown InAlAs Strained Layers	Liu, J. S.; Lee, T. L.; 林浩雄; Wu, C. W.; Liu, J. S.; Lee, T. L.; Lin, Hao-Hsiung; Wu, C. W.
國立成功大學	2003-05-26	Deep level defect in Si-implanted GaN n(+)-p junction	Chen, X. D.; Huang, Y.; Fung, S.; Beling, C. D.; Ling, C. C.; Sheu, Jinn-Kong; Lee, M. L.; Chi, Gou-Chung; Chang, Shoou-Jinn
南台科技大學	2003	Deep level defect in Si-implanted GaN n+-p junction	李明倫; J. K. Sheu;M. L. Lee; G. C. Chi;S. J. Chang
國立交通大學	2014-12-08T15:44:17Z	Deep level transient spectroscopy characterization of InAs self-assembled quantum dots	Ilchenko, VV; Lin, SD; Lee, CP; Tretyak, OV
國立成功大學	2021-02-1	Deep level transient spectroscopy characterization without the Arrhenius plot	Li;Jian;V
國立交通大學	2014-12-08T15:02:21Z	Deep level transient spectroscopy depth profile measurements of polycrystalline zinc oxide ceramic	Lee, WI; Young, RL; Chen, WK
國立交通大學	2019-04-02T05:58:23Z	Deep level transient spectroscopy depth profile measurements of polycrystalline zinc oxide ceramic	Lee, WI; Young, RL; Chen, WK

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