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Institution	Date	Title	Author
元智大學	2004-12	Defect Inspection of Patterned TFT-LCD Panels Usinga Fast Sub-image Based SVD	C.-J. Lu (呂奇傑); 蔡篤銘
元智大學	2004-10	Defect inspection of patterned thin film transistor-liquid crystal display panels using a fast sub-image-based singular value decomposition	C.-J. Lu(呂奇傑); 蔡篤銘
亞洲大學	2016-05	Defect Inspection of Patterned Thin-film Ceramic Light-emitting Diode Substrate Using a Fast Randomized Principal Component Analysis	劉曉薇;Hsiao-Wei,Liu;陳思翰;Ssu-Han,Chen*;彭德保;Der-Baau,Perng;
亞洲大學	2016-05	Defect Inspection of Patterned Thin-film Ceramic Light-emitting Diode Substrate Using a Fast Randomized Principal Component Analysis	劉曉薇;Liu, Hsiao-Wei;陳思翰;Chen, Ssu-Han;*;彭德保;Perng, Der-Baau
亞洲大學	2016-05	Defect Inspection of Patterned Thin-film Ceramic Light-emitting Diode Substrate Using a Fast Randomized Principal Component Analysis	Perng；, 劉曉薇；Hsiao-Wei Liu；陳思翰；Ssu-Han Chen；*；彭德保；Der-Baau
亞洲大學	2016-05	Defect Inspection of Patterned Thin-film Ceramic Light-emitting Diode Substrate Using a Fast Randomized Principal Component Analysis	Perng；, 劉曉薇；Hsiao-Wei Liu；陳思翰；Ssu-Han Chen；*；彭德保；Der-Baau
國立成功大學	2023-05-4	Defect Inspection Using Modified YoloV4 on a Stitched Image of a Spinning Tool	Lin;Bor-Haur;Chen;Ju-Chin;Lien;James, Jenn-Jier
國立中山大學	1990	Defect Microstructure and Dehydroxylation Mechanism of Interstratified Phyllosilicates in Heng-Chun Chromitite: A TEM Study	P. Shen;S.L. Hwang;H.T. Chu
國立中山大學	1988	Defect Microstructure in Aluminized Coatings	P. Shen;D. Gan;S.L. Hwang
國立中山大學	1987	Defect Microstructure of Interstratified Phyllosilicates in Heng-Chun Chromitite	Y.J. Su;S.Y. Chen;H.Y. Lu;P. Shen

Showing items 306646-306655 of 2348973 (234898 Page(s) Totally)
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