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Showing items 306646-306655 of 2348973  (234898 Page(s) Totally)
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Institution Date Title Author
元智大學 2004-12 Defect Inspection of Patterned TFT-LCD Panels Usinga Fast Sub-image Based SVD C.-J. Lu (呂奇傑); 蔡篤銘
元智大學 2004-10 Defect inspection of patterned thin film transistor-liquid crystal display panels using a fast sub-image-based singular value decomposition C.-J. Lu(呂奇傑); 蔡篤銘
亞洲大學 2016-05 Defect Inspection of Patterned Thin-film Ceramic Light-emitting Diode Substrate Using a Fast Randomized Principal Component Analysis 劉曉薇;Hsiao-Wei,Liu;陳思翰;Ssu-Han,Chen*;彭德保;Der-Baau,Perng;
亞洲大學 2016-05 Defect Inspection of Patterned Thin-film Ceramic Light-emitting Diode Substrate Using a Fast Randomized Principal Component Analysis 劉曉薇;Liu, Hsiao-Wei;陳思翰;Chen, Ssu-Han;*;彭德保;Perng, Der-Baau
亞洲大學 2016-05 Defect Inspection of Patterned Thin-film Ceramic Light-emitting Diode Substrate Using a Fast Randomized Principal Component Analysis Perng;, 劉曉薇;Hsiao-Wei Liu;陳思翰;Ssu-Han Chen;*;彭德保;Der-Baau
亞洲大學 2016-05 Defect Inspection of Patterned Thin-film Ceramic Light-emitting Diode Substrate Using a Fast Randomized Principal Component Analysis Perng;, 劉曉薇;Hsiao-Wei Liu;陳思翰;Ssu-Han Chen;*;彭德保;Der-Baau
國立成功大學 2023-05-4 Defect Inspection Using Modified YoloV4 on a Stitched Image of a Spinning Tool Lin;Bor-Haur;Chen;Ju-Chin;Lien;James, Jenn-Jier
國立中山大學 1990 Defect Microstructure and Dehydroxylation Mechanism of Interstratified Phyllosilicates in Heng-Chun Chromitite: A TEM Study P. Shen;S.L. Hwang;H.T. Chu
國立中山大學 1988 Defect Microstructure in Aluminized Coatings P. Shen;D. Gan;S.L. Hwang
國立中山大學 1987 Defect Microstructure of Interstratified Phyllosilicates in Heng-Chun Chromitite Y.J. Su;S.Y. Chen;H.Y. Lu;P. Shen

Showing items 306646-306655 of 2348973  (234898 Page(s) Totally)
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