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Showing items 475911-475920 of 2348973 (234898 Page(s) Totally)
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| 國立交通大學 |
2014-12-08T15:39:25Z |
Hot carrier degradations of dynamic threshold silicon on insulator p-type metal-oxide-semiconductor field effect transistors
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Chao, TS; Lee, YJ; Huang, CY; Lin, HC; Li, YM; Huang, TY |
| 國立中山大學 |
2003 |
Hot carrier dynamics of ZnCdSe epilayers
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D.J. Jang;C.S. Yang;W.C. Chou;K.T Kuo;M.S. Lee |
| 國立交通大學 |
2014-12-08T15:30:23Z |
Hot carrier effect on gate-induced drain leakage current in high-k/metal gate n-channel metal-oxide-semiconductor field-effect transistors
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Dai, Chih-Hao; Chang, Ting-Chang; Chu, Ann-Kuo; Kuo, Yuan-Jui; Ho, Szu-Han; Hsieh, Tien-Yu; Lo, Wen-Hung; Chen, Ching-En; Shih, Jou-Miao; Chung, Wan-Lin; Dai, Bai-Shan; Chen, Hua-Mao; Xia, Guangrui; Cheng, Osbert; Huang, Cheng Tung |
| 國立交通大學 |
2014-12-08T15:24:06Z |
Hot Carrier Effect on Gate-Induced Drain Leakage Current in n-MOSFETs with HfO2/Ti1-xNx Gate Stacks
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Dai, Chih-Hao; Chang, Ting-Chang; Chu, Ann-Kuo; Kuo, Yuan-Jui; Ho, Szu-Han; Hsieh, Tien-Yu; Lo, Wen-Hung; Chen, Ching-En; Shih, Jou-Miao; Chung, Wan-Lin; Dai, Bai-Shan; Chen, Hua-Mao; Xia, Guangrui; Cheng, Osbert; Huang, Cheng Tung |
| 國立交通大學 |
2014-12-08T15:42:33Z |
Hot carrier induced degradation in the low temperature processed polycrystalline silicon thin film transistors using the dynamic stress
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Chang, KM; Chung, YH; Lin, GM |
| 臺大學術典藏 |
2021-09-21T23:19:42Z |
Hot carrier induced photothermal effect on metal-semiconductor schottky junction
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Sun, Ruei Lien; Lai, Hsin Han; CHING-FUH LIN |
| 亞洲大學 |
2014-06-10 |
Hot Carrier Injection (HCI) Reliability and Isolation Voltage Calibration of 80V High-Side NLDMOS and Transient Voltage Suppressor (TVS) Diode
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Kurniawan, Erry Dwi |
| 國立成功大學 |
2023 |
Hot Carrier Injection Reliability of Fabricated N- and P-Type Multi FinFETs with Different TiN Stacks
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Chen, Y.-L.;Yeh, W.-K.;Hsu, Hsu H.-T.;Chen, K.-H.;Lin, W.-C.;Yu, T.-H.;Chou, H.-T.;Godwin, Raj D.;Godfrey, D. |
| 元智大學 |
2008-01 |
Hot carrier photoluminescence in InN epilayers
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柯正浩; M.D. Yang; Y.P. Chen; G.W. Shu; J.L. Shen; S.C. Hung; G.C. Chi; T.Y. Lin; Y.C. Lee; C.T. Chen |
| 國立臺灣海洋大學 |
2008 |
Hot carrier photoluminescence in InN epilayers
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M. D. Yang;Y. P. Chen;G. W. Shu;J. L Shen;S. C. Hung;G. C. Chi;T. Y. Lin;Y. C. Lee;C. T. Chen;C. H. Ko |
Showing items 475911-475920 of 2348973 (234898 Page(s) Totally)
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