臺灣學術機構典藏系統 (Taiwan Academic Institutional Repository, TAIR)

About TAIR
	About TAIR

Browse By
	Institution
	Author
	Title
	Date
	Statistics Chart
	Institution Facts
	Trend

News
	2019臺灣學術機構典藏研討會
	機構典藏系統RC7版本已發佈

Copyright
	Publisher & Journal Policy
	TAIR Copyright Conference Minutes

Related Links
	機構典藏計畫網站
	ROAR
	OpenDOAR
	SHERPA
	OAIster
	JAIRO
	Ira
	DSPACE
	RWWR
	臺大學術典藏NTU Scholars

Jump to: [ Chinese Items ] [ 0-9 ] [ A B C D E F G H I J K L M N O P Q R S T U V W X Y Z ]

or enter the first few letters:

Showing items 475916-475940 of 2349007 (93961 Page(s) Totally)
<< < 19032 19033 19034 19035 19036 19037 19038 19039 19040 19041 > >>
View [10|25|50] records per page

Institution	Date	Title	Author
東海大學	2002	Hot carrier degradation in deep sub-micron nitride spacer lightly doped drain N-channel metal-oxide-semiconductor transistors	Tsai, J.-L.a, Huang, K.-Y.a, Lai, J.-H.b, Gong, J.a, Yang, F.-J.b, Lin, S.-Y.a
國立交通大學	2014-12-08T15:25:51Z	Hot carrier degradation in LDMOS power transistors	Cheng, CC; Wu, JW; Lee, CC; Shao, JH; Wang, T
國立交通大學	2014-12-08T15:39:25Z	Hot carrier degradations of dynamic threshold silicon on insulator p-type metal-oxide-semiconductor field effect transistors	Chao, TS; Lee, YJ; Huang, CY; Lin, HC; Li, YM; Huang, TY
國立中山大學	2003	Hot carrier dynamics of ZnCdSe epilayers	D.J. Jang;C.S. Yang;W.C. Chou;K.T Kuo;M.S. Lee
國立交通大學	2014-12-08T15:30:23Z	Hot carrier effect on gate-induced drain leakage current in high-k/metal gate n-channel metal-oxide-semiconductor field-effect transistors	Dai, Chih-Hao; Chang, Ting-Chang; Chu, Ann-Kuo; Kuo, Yuan-Jui; Ho, Szu-Han; Hsieh, Tien-Yu; Lo, Wen-Hung; Chen, Ching-En; Shih, Jou-Miao; Chung, Wan-Lin; Dai, Bai-Shan; Chen, Hua-Mao; Xia, Guangrui; Cheng, Osbert; Huang, Cheng Tung
國立交通大學	2014-12-08T15:24:06Z	Hot Carrier Effect on Gate-Induced Drain Leakage Current in n-MOSFETs with HfO2/Ti1-xNx Gate Stacks	Dai, Chih-Hao; Chang, Ting-Chang; Chu, Ann-Kuo; Kuo, Yuan-Jui; Ho, Szu-Han; Hsieh, Tien-Yu; Lo, Wen-Hung; Chen, Ching-En; Shih, Jou-Miao; Chung, Wan-Lin; Dai, Bai-Shan; Chen, Hua-Mao; Xia, Guangrui; Cheng, Osbert; Huang, Cheng Tung
國立交通大學	2014-12-08T15:42:33Z	Hot carrier induced degradation in the low temperature processed polycrystalline silicon thin film transistors using the dynamic stress	Chang, KM; Chung, YH; Lin, GM
臺大學術典藏	2021-09-21T23:19:42Z	Hot carrier induced photothermal effect on metal-semiconductor schottky junction	Sun, Ruei Lien; Lai, Hsin Han; CHING-FUH LIN
亞洲大學	2014-06-10	Hot Carrier Injection (HCI) Reliability and Isolation Voltage Calibration of 80V High-Side NLDMOS and Transient Voltage Suppressor (TVS) Diode	Kurniawan, Erry Dwi
國立成功大學	2023	Hot Carrier Injection Reliability of Fabricated N- and P-Type Multi FinFETs with Different TiN Stacks	Chen, Y.-L.;Yeh, W.-K.;Hsu, Hsu H.-T.;Chen, K.-H.;Lin, W.-C.;Yu, T.-H.;Chou, H.-T.;Godwin, Raj D.;Godfrey, D.
元智大學	2008-01	Hot carrier photoluminescence in InN epilayers	柯正浩; M.D. Yang; Y.P. Chen; G.W. Shu; J.L. Shen; S.C. Hung; G.C. Chi; T.Y. Lin; Y.C. Lee; C.T. Chen
國立臺灣海洋大學	2008	Hot carrier photoluminescence in InN epilayers	M. D. Yang;Y. P. Chen;G. W. Shu;J. L Shen;S. C. Hung;G. C. Chi;T. Y. Lin;Y. C. Lee;C. T. Chen;C. H. Ko
國立臺灣大學	2000	Hot carrier recombination model of visible electroluminescence from metal oxide silicon tunneling diodes	Liu, C. W.; Chang, S. T.; Liu, W. T.; Chen, Miin-Jang; Lin, Ching-Fuh
中原大學	2000-12	Hot carrier recombination model of visible electroluminescence from metal-oxide-silicon tunneling diodes	C. W. Liu;S. T. Chang;W. T. Liu;Miin-Jang Chen;Ching-Fuh Lin
臺大學術典藏	2018-09-10T03:29:44Z	Hot carrier recombination model of visible electroluminescence from metal-oxide-silicon tunneling diodes	Liu, C.W.; Chang, S.T.; Liu, W.T.; Chen, M.-J.; Lin, C.-F.; CHEE-WEE LIU
臺大學術典藏	2018-09-10T03:29:28Z	Hot carrier recombination model of visible electroluminescence from metal-oxide-silicon tunneling diodes	Liu, C.W.; Chang, S.T.; Liu, W.T.; Chen, M.-J.; Lin, C.-F.; CHING-FUH LIN
國立交通大學	2014-12-08T15:44:34Z	Hot carrier reliability improvement by utilizing phosphorus transient enhanced diffusion for input/output devices of deep submicron CMOS technology	Wang, HCH; Diaz, CH; Liew, BK; Sun, JYC; Wang, TH
國立暨南國際大學	2013	Hot carrier-induced emission from the InGaN/GaN light-emitting diode by characterizing reverse-bias electroluminescence	陳祥; Chen, H
臺大學術典藏	2018-09-10T14:55:46Z	Hot carriers in epitaxial graphene sheets with and without hydrogen intercalation: Role of substrate coupling	Lo, S.-T.; Chuang, C.; Woo, T.-P.; Lee, H.-Y.; Liu, C.-W.; Liu, C.-I.; Huang, L.-I.; Liu, C.-H.; Yang, Y.; Chang, C.-Y.S.; Li, L.-J.; Mende, P.C.; Feenstra, R.M.; Elmquist, R.E.; Liang, C.-T.; CHI-TE LIANG
臺大學術典藏	2019-12-27T01:16:42Z	Hot carriers in epitaxial graphene sheets with and without hydrogen intercalation: Role of substrate coupling	Liu, F.-H.; Lo, S.-T.; Chuang, C.; Woo, T.-P.; Lee, H.-Y.; Liu, C.-W.; Liu, C.-I.; Huang, L.-I.; Liu, C.-H.; Yang, Y.; Chang, C.-Y.S.; Li, L.-J.; Mende, P.C.; Feenstra, R.M.; Elmquist, R.E.; Liang, C.-T.; TAK-PONG WOO
中華大學	2011	Hot Compressive Flow Behavior of Inconel 600 Superalloy	吳泓瑜; Wu, Horng-yu
中華大學	2013	Hot compressive flow stress modeling of homogenized AZ61 Mg alloy using strain-dependent constitutive equations	吳泓瑜; Wu, Horng-yu
國立虎尾科技大學	2006	Hot corrosion behavior of laser-glazed plasma-sprayed yttria-stabilized zirconia thermal barrier coatings in the presence of V2O5	Tsai, P.C.;Lee, J.H.;Hsu, C.S.
國立交通大學	2014-12-08T15:30:32Z	Hot Cracking in AZ31 and AZ61 Magnesium Alloy	Huang, C. J.; Cheng, C. M.; Chou, C. P.; Chen, F. H.
國立交通大學	2014-12-08T15:19:02Z	Hot cracking of welds on heat treatable aluminium alloys	Cheng, CM; Chou, CP; Lee, IK; Lin, HY

Showing items 475916-475940 of 2349007 (93961 Page(s) Totally)
<< < 19032 19033 19034 19035 19036 19037 19038 19039 19040 19041 > >>
View [10|25|50] records per page

	English \| 正體中文 \| 简体中文 \| Total items :2856600
	Visitors : 53477527 Online Users : 1113 Project Commissioned by the Ministry of Education Project Executed by National Taiwan University Library