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Institution Date Title Author
臺大學術典藏 2018-09-10T14:52:12Z Nanoscale analysis of a functionalized polythiophene surface by adhesion mapping SHYH-CHYANG LUO;Yu, H.-H.;Zhu, B.;Luo, S.-C.;Park, J.W.;Kwak, J.-W.;Lee, J.-E.;SHYH-CHYANG LUO; Lee, J.-E.; Kwak, J.-W.; Park, J.W.; Luo, S.-C.; Zhu, B.; Yu, H.-H.; SHYH-CHYANG LUO
國立成功大學 2014 Nanoscale analysis of functionalized polythiophene surfaces: the effects of electropolymerization methods and thermal treatment Lee, Jae-Eun; Luo, Shyh-Chyang; Zhu, Bo; Park, Joon Won; Yu, Hsiao-hua
臺大學術典藏 2018-09-10T14:52:12Z Nanoscale analysis of functionalized polythiophene surfaces: The effects of electropolymerization methods and thermal treatment SHYH-CHYANG LUO;Yu, H.-H.;Park, J.W.;Zhu, B.;Luo, S.-C.;Lee, J.-E.;SHYH-CHYANG LUO; Lee, J.-E.; Luo, S.-C.; Zhu, B.; Park, J.W.; Yu, H.-H.; SHYH-CHYANG LUO
臺大學術典藏 2021-10-25T09:17:44Z Nanoscale assembly of complex structures by controlled elastic instability of micro-structured elastomeric membrane Y. Zhang; E. A. Matsumoto; A. Peter; P. C. Lin; R. D. Kamien; S. Yang; PEI-CHUN LIN
國立暨南國際大學 2007 Nanoscale bias-annealing effect in postirradiated thin silicon dioxide films observed by conductive atomic force Microscopy 張淙旻?; Chang, TM
國立暨南國際大學 2007 Nanoscale bias-annealing effect in postirradiated thin silicon dioxide films observed by conductive atomic force Microscopy 林式庭?; Lin, ST
國立暨南國際大學 2007 Nanoscale bias-annealing effect in postirradiated thin silicon dioxide films observed by conductive atomic force Microscopy 吳幼麟?; Wu, YL
國立高雄大學 2005 Nanoscale Bimetallic Pd/Fe Particles for Remediation of Halogenated Methanes 連興隆; Sun, Yuan-Pang; Zhang, Wei-Xian
義守大學 2014-04 Nanoscale Bondability between Cu-Al Intermetallic Compound for Cu Wirebonding H.C. Hsu;J.H. Chien;J.S. Huang;L.M. Chu;S.L. Fu
義守大學 2012-10 Nanoscale bondability study on copper-aluminum intermetallic compound using molecular dynamics simulation Hsiang-Chen Hsu;Jih-Hsin Chien;Li-Ming Chu;Shin-Pon Ju;Yu-Ting Feng;Shen-Li Fu

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