English  |  正體中文  |  简体中文  |  Total items :2856597  
Visitors :  53453736    Online Users :  990
Project Commissioned by the Ministry of Education
Project Executed by National Taiwan University Library
 
臺灣學術機構典藏系統 (Taiwan Academic Institutional Repository, TAIR)
About TAIR

Browse By

News

Copyright

Related Links

Jump to: [ Chinese Items ] [ 0-9 ] [ A B C D E F G H I J K L M N O P Q R S T U V W X Y Z ]
or enter the first few letters:   

Showing items 636916-636940 of 2348973  (93959 Page(s) Totally)
<< < 25472 25473 25474 25475 25476 25477 25478 25479 25480 25481 > >>
View [10|25|50] records per page

Institution Date Title Author
國立臺灣大學 2006 Optical characterization of GaN microcavity fabricated by wet etching Lu, C.-Y.; Wang, S.-L.; Wu, H.-M.; Peng, L.-H.
國立高雄師範大學 2008-02 Optical Characterization of Ge/Si Superlattices with Stacked Nanoripples 李佳任; Jia-Ren Lee;S. C. Lin;C. R. Lu;J. H. Lin;C. T. Chi
國立交通大學 2019-04-02T05:58:39Z Optical Characterization of Gold Nanoblock Dimers: From Capacitive Coupling to Charge Transfer Plasmons and Rod Modes Su, Man-Nung; Sun, Quan; Ueno, Kosei; Chang, Wei-Shun; Misawa, Hiroaki; Link, Stephan
臺大學術典藏 2019-12-27T07:49:07Z Optical characterization of graphene and its derivatives: An experimentalist's perspective Nguyen, D.-T.;Hsieh, Y.-P.;Hofmann, M.; Nguyen, D.-T.; Hsieh, Y.-P.; Hofmann, M.; Mario Hofmann
國立臺灣科技大學 2006 Optical Characterization of II-VI Wide Band Gap Semiconductor Materials 黃鵬仁
國立成功大學 2013-02-01 Optical characterization of InAlAs/InGaAs metamorphic high-electron mobility transistor structures with tensile and compressive strain Chan, Ching-Hsiang; Ho, Ching-Hwa; Chen, Ming-Kai; Lin, Yu-Shyan; Huang, Ying-Sheng; Hsu, Wei-Chou
國立高雄師範大學 2005-11 Optical Characterization of InGaAsN/GaAsN/GaAs Quantum Wells with InGaP Cladding Layers 李佳任; C. R. Lu;H. L. Liu;Jia-Ren Lee;C. H. Wu;H.H Lin
國立臺灣大學 2005 Optical characterization of InGaAsN/GaAsN/GaAs quantum wells with InGaP cladding layers Lu, C.R.; Liu, H.L.; Lee, J.R.; Wu, C.H.; Lin, H.H.; Sung, L.W.
臺大學術典藏 2018-09-10T05:26:30Z Optical characterization of InGaAsN/GaAsN/GaAs quantum wells with InGaP cladding layers C. R. Lu,; H. L. Liu,; J. R. Lee,; C. H. Wu,; H. H. Lin,; L. W. Sung,; HAO-HSIUNG LIN
國立臺灣科技大學 2010 Optical characterization of intersubband transitions in Zn xCd1-xSe/Znx′Cdy′Mg 1-x′-y′Se asymmetric coupled quantum well structures by contactless electroreflectance Wu J.-D.; Huang C.-T.; Huang Y.-S.; Charles W.O.; Shen A.; Zhang Q.; Tamargo M.C.
國立交通大學 2014-12-08T15:46:11Z Optical characterization of isoelectronic ZnSe(1-x)O(x) semiconductors Lin, Y. C.; Chung, H. L.; Ku, J. T.; Chen, C. Y.; Chien, K. F.; Fan, W. C.; Lee, L.; Chyi, J. I.; Chou, W. C.; Chang, W. H.; Chen, W. K.
國立交通大學 2019-04-02T05:58:53Z Optical characterization of isoelectronic ZnSe1-xOx semiconductors Lin, Y. C.; Chung, H. L.; Ku, J. T.; Chen, C. Y.; Chien, K. F.; Fan, W. C.; Lee, L.; Chyi, J. I.; Chou, W. C.; Chang, W. H.; Chen, W. K.
臺大學術典藏 2018-09-10T08:37:16Z Optical characterization of MBE-Grown ZnO epilayers Karaliunas, M.;Serevicius, T.;Kuokstis, E.;Jursenas, S.;Ting, S.Y.;Huang, J.J.;Yang, C.C.; Karaliunas, M.; Serevicius, T.; Kuokstis, E.; Jursenas, S.; Ting, S.Y.; Huang, J.J.; Yang, C.C.; CHIH-CHUNG YANG
國立臺灣科技大學 2007 Optical characterization of niobium-doped rhenium disulphide single crystals Dumcenco, D.O.;Huang, Y.S.;Liang, C.H.;Tiong, K.K.
國立臺灣海洋大學 2007 Optical characterization of niobium-doped rhenium disulphide single crystals D. O. Dumcenco1;Y. S. Huang;C. H. Liang;K. K. Tiong
國立成功大學 2018-03-20 Optical characterization of porcine articular cartilage using a polarimetry technique with differential Mueller matrix formulism Chang;Ching-Min;Lo;Yu-Lung;Tran;Nghia-Khanh;Chang;Yu-Jen
國立臺灣海洋大學 2008-05-22 Optical characterization of quaternary Zn1-x-yBexMgySe mixed crystals D.O. Dumcenco; Y.S. Huang; F. Firszt; S. Legowski; H. Meczynska; K.K. Tiong
國立臺灣科技大學 2015 Optical characterization of strong UV luminescence emitted from the excitonic edge of nickel oxide nanotowers Ho, C.-H.;Kuo, Y.-M.;Chan, Chan C.-H.;Ma, Y.-R.
國立臺灣科技大學 2016 Optical characterization of structural quality in the formation of In2O3 thin-film nanostructures Chan, Chan C.-H;Lin, M.-H;Chao, L.-C;Lee, K.-Y;Tien, L.-C;Ho, C.-H.
臺大學術典藏 2018-09-10T07:09:09Z Optical characterization of subwavelength semiconductor nipple lens array H.-M. Wu,; J.-W. Yu,; C. M. Lai,; H.-C. Chang,; L.-H. Peng,; LUNG-HAN PENG
臺大學術典藏 2019-07-15T04:24:37Z Optical characterization of the Au nanoparticle monolayer on silicon wafer Wang D.-S.;Chuang L.;Lin C.-W.; Wang D.-S.; Chuang L.; Lin C.-W.
國立臺灣科技大學 2009 Optical characterization of thin epitaxial GaAs films on Ge substrates Wu J.D.; Huang Y.S.; Brammertz G.; Tiong K.K.
國立臺灣海洋大學 2009 Optical characterization of thin epitaxial GaAs films on Ge substrates J. D. Wu; Y. S. Huang; G. Brammertz; K. K. Tiong
國立屏東大學 2005 Optical characterization of two-dimensional photonic crystals based on spectroscopic ellipsometry with rigorous coupled-wave analysis 張雯惠;CH, Lin;Chen, HL;Chao, WC;Hsieh, CI;Chang, WH.
國立臺灣大學 2006 Optical Characterization of Two-dimensional Photonic Crystals Based on Spectroscopic Ellipsometry with Rigorous Coupled-Wave Analysis Lin, Chun-Hung; Chen, Hsuen-Li; Chao, Wen-Chi; Hsieh, Chung-I; Chang, Wen-Huei

Showing items 636916-636940 of 2348973  (93959 Page(s) Totally)
<< < 25472 25473 25474 25475 25476 25477 25478 25479 25480 25481 > >>
View [10|25|50] records per page