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Institution	Date	Title	Author
國立臺灣海洋大學	2008-07-15	Optical Characterization of Zn095-xBe005MnxSe Mixed Crystals	H. P. Hsu; T. W. Chang; Y. S. Huang; F. Firszt; S. Łegowski; H Meczynska; A. Marasek; K. Strzałkowski; K. K. Tiong; M. Munoz
國立交通大學	2014-12-08T15:43:11Z	Optical characterization of ZnMnO thin films on c-Al2O3	Lin, H. J.; Lin, D. Y.; Wu, J. S.; Chou, W. C.; Yang, C. S.; Wang, J. S.; Lo, W. H.
國立彰化師範大學	2008-07	Optical Characterization of ZnMnO Thin Films on c-Al2O3	Lin, H. J. ; Lin, D. Y. ; Wu, Jenq-Shinn; Chou, W. C. ;Yang, C. S. ; Wang, J. S. ; Lo, W. H.
國立臺灣大學	2006	Optical Characterization of ZnO Materials Grown by Modified Melt Growth Technique	Feng, Z. C.; Yu, J. W.; Wang, J. B.; Varatharajan, R.; Nemeth, B.; Nause, J.; Ferguson, I.; Lu, W.; Collins, W. E.
國立交通大學	2014-12-08T15:17:04Z	Optical characterization of ZnSe epilayers and ZnCdSe/ZnSe quantum wells grown on Ge/Ge0.95Si0.05/Ge0.9Si0.1/Si virtual substrates	Ku, JT; Kuo, MC; Shen, JL; Chiu, KC; Yang, TH; Luo, GL; Chang, CY; Lin, YC; Fu, CP; Chuu, DS; Chia, CH; Chou, WC
臺大學術典藏	2018-09-10T04:14:57Z	Optical characterization on InAs/GaAs quantum dots	C. M. Lai,; F. Y. Chang,; C. W. Chang,; H. H. Lin,; G. J. Jan,; HAO-HSIUNG LIN
國立暨南國際大學	2013	Optical characterizations and reverse-bias electroluminescence observation for reliability investigations of the InGaN light emitting diode	陳祥; Chen, H
國立暨南國際大學	2013	Optical characterizations and reverse-bias electroluminescence observation for reliability investigations of the InGaN light emitting diode	Liao, CH; Liao, CH
國立暨南國際大學	2013	Optical characterizations and reverse-bias electroluminescence observation for reliability investigations of the InGaN light emitting diode	Lin, CW; Lin, CW
國立交通大學	2014-12-08T15:28:25Z	Optical characterizations and reverse-bias electroluminescence observation for reliability investigations of the InGaN light emitting diode	Chen, Hsiang; Yeh, Yih-Min; Liao, Chuan Hao; Lin, Chun Wei; Kao, Chuan-Haur; Lu, Tien-Chang

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