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Institution	Date	Title	Author
國立交通大學	2014-12-08T15:24:27Z	Oxide interfaces: pathways to novel phenomena	Yu, Pu; Chu, Ying-Hao; Ramesh, Ramamoorthy
國立中山大學	2007-06	Oxide Islands Design for Elimination of Ultra-shallow Junction Formation	Jyi-Tsong Lin;Yi-Chuen Eng
大葉大學	2015-12-18	Oxide layer in metal-oxide-semiconductor field effect transistor and its effect on threshold voltage	Fan, Jung-Chuan;Lee, Tsung-Che;Lee, Li-Ying;Lee, Shih-Fong
大葉大學	2016-07-11	Oxide layer in metal-oxide-semiconductor field effect transistor and its effect on threshold voltage	Fan, Jung-Chuan;Lee, Shih-Fong
國立成功大學	2009-11-18	Oxide mediated liquid-solid growth of high aspect ratio aligned gold silicide nanowires on Si(110) substrates	Bhatta, Umananda M.; Rath, Ashutosh; Dash, Jatis K.; Ghatak, Jay; Lai Yi-Feng; Liu, Chuan-Pu; Satyam, P. V.
臺大學術典藏	1990-07	Oxide Resistance Characterization in MOS structures by the Voltage Decay Method	Hwu, Jenn-Gwo; Ho, I-Hsiu; Hwu, Jenn-Gwo; Ho, I-Hsiu
國立臺灣大學	1990-07	Oxide Resistance Characterization in MOS structures by the Voltage Decay Method	Hwu, Jenn-Gwo; Ho, I-Hsiu
臺大學術典藏	2018-09-10T04:13:01Z	Oxide roughness effect on tunneling current of MOS diodes	Hsu, B.-C.; Chen, K.-F.; Lai, C.-C.; Lee, S.W.; Liu, C.W.; CHEE-WEE LIU
國立臺灣大學	2002	Oxide roughness effect on tunneling current of MOS diodes	Hsu, B.-C.; Chen, K.-F.; Lai, C.-C.; Lee, S.W.; Liu, C.W.
臺大學術典藏	2018-09-10T03:48:04Z	Oxide roughness enhanced reliability of MOS tunneling diodes	Lin, C.-H.; Lee, M.H.; Hsu, B.-C.; Chen, K.-F.; Shie, C.-R.; Liu, C.W.; CHEE-WEE LIU

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