| 國立臺灣海洋大學 |
2018 |
Test Command Auto-Wait Mechanisms for Record and Playback-Style Web Application Testing
|
Shin-Jie Lee;Yu-Xian Chen;Shang-Pin Ma;Wen-Tin Lee |
| 國立臺灣海洋大學 |
2018 |
Test Command Auto-Wait Mechanisms for Record and Playback-Style Web Application Testing
|
Shin-Jie Lee;Yu-Xian Chen;Shang-Pin Ma;Wen-Tin Lee |
| 國立體育大學 |
2007-12-09 |
Test Construction and Effect Analysis Psychomotor
|
姚漢禱; Yau, Han-Dau |
| 國立體育大學 |
2008-06-13 |
Test Construction Using Rasch Measurement
|
姚漢禱; Yau, Han-Dau |
| 國立交通大學 |
2014-12-08T15:21:09Z |
Test coverage optimization for large code problems
|
Lin, Ying-Dar; Chou, Chi-Heng; Lai, Yuan-Cheng; Huang, Tse-Yau; Chung, Simon; Hung, Jui-Tsun; Lin, Frank C. |
| 國立臺灣科技大學 |
2012 |
Test coverage optimization for large code problems
|
Lin, Ying-Dar;Chou, Chi-Heng;Lai, Yuan-Cheng;Huang, Tse-Yau;Chung, Simon;Hung, Jui-Tsun;Lin, Frank C. |
| 國立臺灣科技大學 |
2012 |
Test coverage optimization for large code problems
|
Lin, Y.-D.;Chou, C.-H.;Lai, Y.-C.;Huang, T.-Y.;Chung, S.;Hung, J.-T.;Lin, F.C. |
| 國立中山大學 |
2007-08 |
Test Data and Test Time Reduction for LOS Transition Test in Multi-Mode Segmented Scan Architecture
|
S.J. Wang;P.C. Tsai;H.M. Weng;K.S.M. Li |
| 元智大學 |
2021-08-03 |
Test Data Compression Based on Diamond-Shaped Patterns
|
Fu-Ting Wang; Yu-Chen Hzu; Yung-Chih Chen; Wang-Dauh Tseng |
| 元智大學 |
2021-08-03 |
Test Data Compression Based on Diamond-Shaped Patterns
|
Fu-Ting Wang; Yu-Chen Hzu; Yung-Chih Chen; Wang-Dauh Tseng |
| 元智大學 |
2010-06 |
Test Data Compression Using Multi-dimensional Pattern Run-length Codes
|
曾王道; Lung-Jen Lee |
| 國立成功大學 |
2017-04-05 |
Test decompressor and test method thereof
|
Lee, Kuen-Jong (TW);Chen, Jhen-Zong (TW) |
| 國立臺灣師範大學 |
2015-09-03T01:06:00Z |
Test Designs for Elementary School Students
|
Chen, C.-Y. Doris |
| 國立臺灣大學 |
1993 |
Test Dose Guided Rapid IV Suramine Infusions with Weekly IV Maintenance Doses
|
Arzoomanian, R.; Tombes, M. B.; Alberti, D.; Tusch, K.; Mutch, R.; Rago, R.; 鄭安理; Spriggs, D.; Wilding, G.; Arzoomanian, R.; Tombes, M. B.; Alberti, D.; Tusch, K.; Mutch, R.; Rago, R.; Cheng, Ann-Lii; Spriggs, D.; Wilding, G. |
| 大葉大學 |
2006-09 |
Test Emission Characteristics of Motorcycles in Central Taiwan
|
Lin, Chi-Wen;Lu, San-Ju;Lin, Kuo-Shian |
| 國立臺灣海洋大學 |
2006-09 |
Test emission characteristics of motorcycles in Central Taiwan.
|
Lin, Chi-Wen; San-Ju Lu; Kuo-Shian Lin |
| 臺大學術典藏 |
2019-04-24T02:28:11Z |
Test feasibility of next-generation sequencing assays in clinical mutation detection of small biopsy and fine needle aspiration specimens
|
Zheng, Gang;Tsai, Harrison;Li-Hui Tseng;Illei, Peter;Gocke, Christopher D.;Eshleman, James R.;Netto, George;Lin, Ming Tseh; Zheng, Gang; Tsai, Harrison; LI-HUI TSENG; Illei, Peter; Gocke, Christopher D.; Eshleman, James R.; Netto, George; Lin, Ming Tseh |
| 臺大學術典藏 |
2022-03-10T07:58:38Z |
Test feasibility of next-generation sequencing assays in clinical mutation detection of small biopsy and fine needle aspiration specimens
|
Zheng G.; Tsai H.; LI-HUI TSENG; Illei P.; Gocke C.D.; Eshleman J.R.; Netto G.; Lin M.-T. |
| 淡江大學 |
2008-05 |
Test for Exponential Parameter Based on Type-I Censored Data
|
Liang, Tachen; Huang, Wen-Tao; Yang, Kun-Cheng |
| 國立交通大學 |
2014-12-08T15:24:46Z |
Test generation and site of fault for combinational circuits using logic Petri nets
|
Jui-I Tsai; Ching-Cheng Teng; Ching-Hung Lee |
| 國立成功大學 |
2017 |
Test generation for open and delay faults in CMOS circuits
|
Wu, C.-H.;Lee, K.-J.;Reddy, S.M. |
| 臺大學術典藏 |
2018-09-10T09:50:54Z |
Test Generation of Path Delay Faults Induced by Defects in Power TSV
|
Chi-Jih Shih;Shih-An Hsieh;Yi-Chang Lu;James Chien-Mo Li;Tzong-Lin Wu;K. Chakrabarty; Chi-Jih Shih; Shih-An Hsieh; Yi-Chang Lu; James Chien-Mo Li; Tzong-Lin Wu; K. Chakrabarty; CHIEN-MO LI |
| 臺大學術典藏 |
2020-06-11T06:15:26Z |
Test generation of path delay faults induced by defects in power TSV
|
Shih, C.-J.;Hsieh, S.-A.;Lu, Y.-C.;Li, J.C.-M.;Wu, T.-L.;Chakrabarty, K.; Shih, C.-J.; Hsieh, S.-A.; Lu, Y.-C.; Li, J.C.-M.; Wu, T.-L.; Chakrabarty, K.; TZONG-LIN WU |
| 臺大學術典藏 |
2020-06-16T06:36:17Z |
Test generation of path delay faults induced by defects in power TSV
|
Shih, C.-J.;Hsieh, S.-A.;Lu, Y.-C.;Li, J.C.-M.;Wu, T.-L.;Chakrabarty, K.; Shih, C.-J.; Hsieh, S.-A.; Lu, Y.-C.; Li, J.C.-M.; Wu, T.-L.; Chakrabarty, K.; YI-CHANG LU |
| 臺大學術典藏 |
2020-06-29T01:20:10Z |
Test Generation of Path Delay Faults Induced by Defects in Power TSV.
|
Shih, Chi-Jih;Hsieh, Shih-An;Lu, Yi-Chang;Li, James Chien-Mo;Wu, Tzong-Lin;Chakrabarty, Krishnendu; Shih, Chi-Jih; Hsieh, Shih-An; Lu, Yi-Chang; Li, James Chien-Mo; Wu, Tzong-Lin; Chakrabarty, Krishnendu; CHIEN-MO LI |
